{"id":335906,"date":"2024-10-19T23:28:08","date_gmt":"2024-10-19T23:28:08","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-19-30393421-dc\/"},"modified":"2024-10-25T22:25:11","modified_gmt":"2024-10-25T22:25:11","slug":"bsi-19-30393421-dc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-19-30393421-dc\/","title":{"rendered":"BSI 19\/30393421 DC"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and abbreviations 3.1 Terms and definitions 3.1.1 3.1.2 3.1.3 3.2 Abbreviations 4 Measuring method of contact resistance 4.1 General <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 4.2 Preparation of TEGs 4.3 Measuring apparatus 4.4 Environmental condition and precondition for measuring <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.5 Measuring procedure 4.6 Data analysis 4.6.1 Calculations procedure of normalized resistances for each TEGs 4.6.2 Derivation procedure of contact resistance <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4.7 Report <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Annex A (informative) Examples of sets of source and drain electrodes layouts in the TEG A.1 Examples of layouts of source and drain electrodes sets in TEG <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" BS EN IEC 62899-503-3. Printed electronics – Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method<\/b><\/p>\n |