{"id":302390,"date":"2024-10-19T20:39:31","date_gmt":"2024-10-19T20:39:31","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-15063-12014\/"},"modified":"2024-10-25T18:10:37","modified_gmt":"2024-10-25T18:10:37","slug":"bs-en-15063-12014","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-15063-12014\/","title":{"rendered":"BS EN 15063-1:2014"},"content":{"rendered":"
This European Standard provides guidance on the concepts and procedures for the calibration and analysis of copper and copper alloys by wavelength dispersive X-ray fluorescence spectrometry.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
4<\/td>\n | Contents Page <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | 1 Scope 2 Principle 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 4 Instrumentation 4.1 Principles of X-ray fluorescence spectrometers <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.2 X-ray tubes Table 1 \u2014 Comparison between end-window and side-window tubes <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Table 2 \u2014 Anode materials for X-ray tubes and corresponding fields of application 4.3 Vacuum system 4.4 Test sample spinner 4.5 Filters <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 4.6 Collimators of slits 4.7 Analysing crystals Table 3 \u2014 Crystals and their fields of application <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Table 4 \u2014 Typical set of crystals for the analysis of copper and copper alloys 4.8 Counters <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4.9 Simultaneous and sequential Instruments 5 Sampling and test sample preparation 6 Evaluation methods 6.1 General 6.2 Dead time correction <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 6.3 Background correction 6.4 Line interference correction models 6.5 Inter-element effects correction models <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 7 Calibration procedure 7.1 General <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 7.2 Optimizing of the diffraction angle (2\u03b8) 7.3 Selecting optimum conditions for detectors 7.4 Selecting optimum tube voltage and current 7.5 Selecting minimum measuring times 7.6 Selecting calibration samples <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 7.7 Selecting drift control and recalibration samples 7.8 Measuring the calibration samples 7.9 Regression calculations 8 Method validation (accuracy and precision) <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 9 Performance criteria 9.1 General 9.2 Precision test 9.3 Performance monitoring 9.4 Maintenance <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Table 5 \u2014 Example of checks and maintenance work to be carried out on X-ray fluorescence spectrometers 10 Radiation protection <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Annex A (informative) Example of calculating background equivalent concentration, limit of detection, limit of quantification and lower limit of detection <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Annex B (informative) Example of calculating line interference of one element to another <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex C (informative) Example of performance criteria obtained under repeatability conditions Table C.1 \u2014 Performance criteria <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Copper and copper alloys. Determination of main constituents and impurities by wavelength dispersive X-ray fluorescence spectrometry (XRF) – Guidelines to the routine method<\/b><\/p>\n |