CISPR 17:2011 specifies methods to measure the radio interference suppression characteristics of passive EMC filtering devices used in power and signal lines, and in other circuits. The defined methods may also be applied to combinations of over-voltage protection devices and EMC filtering devices. The measurement method covers the frequency range from 9 kHz to several GHz depending on the device and test circuit. The standard describes procedures for laboratory tests (type tests) as well as factory tests. The suppression characteristics of EMC filters and components used for the suppression of EM disturbances, are a function of numerous variables such as impedance of the circuits to which they connect, operating voltage and current, and ambient temperature. This standard specifies uniform test methods that will enable comparison of filtering and suppression characteristics determined by test laboratories or specified by manufacturers. Measurement procedures are provided for unbiased and bias conditions. Measurements under bias conditions are performed to determine potential non-linear behaviour of the EMC filtering devices such as saturation effects in inductors with magnetic cores. This testing serves to show the usability in a specific application (such as frequency converters that produce high amplitudes of common mode pulse current and thus may drive inductors into saturation). Measurement under bias conditions may be omitted if the non-linear behaviour can be determined by other methods (e.g. separate saturation measurement of the inductors used). The first edition of CISPR 17 (1981) prescribed the measurement methods of insertion loss mainly for power-line filters. Today, however, many types of sophisticated EMC filters and suppression components can be found in various electronic devices. Those filters need to be characterized using standardized measurement methods. New methods for measurement of impedance and S-parameters for such EMI devices are included in this second edition.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English \n CONTENTS <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and abbreviations 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 3.2 Abbreviations 4 Classification of EMC filtering devices <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | Tables \n Table 1 \u2013 Examples of EMC filtering devices <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 4.1 Insertion loss 4.2 Impedance <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 4.3 S-parameters Figures \n Figure 1 \u2013 Measurement arrangement for S-parameters of a two-terminal device Figure 2 \u2013 Measurement arrangement for S-parameters of a three-terminal device <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | Figure 3 \u2013 Measurement arrangement for four-port S-parameters <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5 Insertion loss measurement 5.1 General <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 5.2 Measurement set-up Figure 4 \u2013 Test circuit for insertion loss measurement (example: 4-line-filter) <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Figure 5 \u2013 Test circuit for asymmetrical insertion loss measurement (example: 4linefilter) <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Figure 6 \u2013 Test circuit for symmetrical insertion loss measurement (example: 4-line-filter) <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 5.3 Measurement methods (procedure) Figure 7 \u2013 Test circuit for unsymmetrical insertion loss measurement (example: 4line\u00a0filter) <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | Figure 8 \u2013 Test circuit for insertion loss measurement without bias Figure 9 \u2013 Test circuit for insertion loss measurement with bias <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 5.4 Calibration and verification Figure 10 \u2013 Test circuit for verification of measurement circuit without bias <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | Table 2 \u2013 Conditions and target values for validation of test set-up without bias <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | Figure 11 \u2013 Test circuit for verification of measurement circuit with bias Table 3 \u2013 Conditions and target values for validation of test set-up with bias <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 5.5 Uncertainty 6 Impedance measurement 6.1 General 6.2 Direct method <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 6.3 Indirect method <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Figure 12 \u2013 One-port measurement of a two-terminal device Figure 13 \u2013 S-parameter measurements for evaluating the impedance of a device in a series connection Figure 14 \u2013 S-parameter measurements for evaluating the impedance of a device in a shunt connection <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | 7 S-parameter measurement 7.1 Measurement set-up and procedure Figure 15 \u2013 Two-port S-parameter measurement set-up <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | Figure 16 \u2013 An alternative measurement system specifically for the insertion loss of a DUT (using a combination of tracking generator and measuring receiver) <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | Figure 17 \u2013 Symbolic expressions Figure 18 \u2013 Test fixture for a two-terminal device (series connection) <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | Figure 19 \u2013 Test fixture for a two-terminal device (shunt connection) Figure 20 \u2013 Test fixture for a three-terminal filter <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | Figure 21 \u2013 Test fixture for a two-terminal device with leads <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | Figure 22 \u2013 Test fixture for a three-terminal filter with leads Figure 23 \u2013 Test fixture for a core device <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | 7.2 Calibration of test set-up 7.3 Measurement uncertainties 8 Presentation of results 8.1 General Figure 24 \u2013 Example of the standards for TRL calibration <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | 8.2 Insertion loss 8.3 Impedance 8.4 S-parameters <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | Annex A (normative) Uncertainty estimation for the measurement of \nthe suppression characteristics of EMC filtering devices <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | Table A.1 \u2013 Measurement uncertainty of insertion loss (example) <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | Table A.2 \u2013 Measurement uncertainty of impedance (example) Table A.3 \u2013 Measurement uncertainties of |S21| and |S12| (example) Table A.4 \u2013 Measurement uncertainties of |S11| and |S22| (example) <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | Annex B (informative) \nExamples of test boxes for insertion loss measurement Figure B.1 \u2013 Design of typical test box for general-purpose filters <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | Figure B.2 \u2013 3D view of typical test box for general purpose filters <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | Figure B.3 \u2013 Design of typical test box for feedthrough components Figure B.4 \u2013 3D view of typical test box for feedthrough components <\/td>\n<\/tr>\n | ||||||
| 51<\/td>\n | Annex\u00a0C (informative) \nInsertion loss test methods with non-50 \u2126 systems Figure C.1 \u2013 Test circuit <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | Annex D (informative) \nRealization of the buffer-network for insertion loss measurement Figure D.1 \u2013 Example of connecting buffer-networks for test with bias <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | Table D.1 \u2013 Specifications of the elements of buffer-networks <\/td>\n<\/tr>\n | ||||||
| 55<\/td>\n | Annex E (informative) Insertion loss measurement \u2013 \nGeneral discussion Figure E.1 \u2013 Test circuit for insertion loss measurement, reference measurement (filter replaced by a short circuit) <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | Figure E.2 \u2013 Test circuit for insertion loss measurement, measurement of filter under test <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | Annex F (informative) \nSet-up for impedance measurement Figure F.1 \u2013 Measurement set-up for a leaded device (DUT) <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | Figure F.2 \u2013 Four-terminal test fixture for a leaded device (DUT) Figure F.3 \u2013 Measurement set-up for an SMD <\/td>\n<\/tr>\n | ||||||
| 60<\/td>\n | Figure F.4 \u2013 Clamp-type test fixture Figure F.5 \u2013 Coaxial test fixture for an SMD <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | Figure F.6 \u2013 Press-type test fixture for an SMD Figure F.7 \u2013 Connection for CMCC measurement <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | Figure F.8 \u2013 Test fixture and measurement set-up for an SMD common-mode choke coil <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | Annex G (informative) \nS-parameter measurement of common-mode choke coils Figure G.1 \u2013 Common-mode choke coil Figure G.2 \u2013 Set-up for measurements of common-mode characteristics <\/td>\n<\/tr>\n | ||||||
| 64<\/td>\n | Figure G.3 \u2013 Test fixture for an SMD Figure G.4 \u2013 Test fixture for a leaded device <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | Figure G.5 \u2013 Set-up for measurements of differential-mode characteristics Figure G.6 \u2013 Test fixture for an SMD Figure G.7 \u2013 Test fixture for a leaded device <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | Figure G.8 \u2013 Set-up for measurement of four-port S-parameters Figure G.9 \u2013 Test fixture for the four-port S-parameters of an SMD <\/td>\n<\/tr>\n | ||||||
| 67<\/td>\n | Figure G.10 \u2013 Test fixture for the four-port S-parameters of a leaded device <\/td>\n<\/tr>\n | ||||||
| 68<\/td>\n | Annex H (informative) \nMeasurement set-up for S-parameters of a DUT without wire leads Figure H.1 \u2013 S-parameters measurement of a DUT without leads <\/td>\n<\/tr>\n | ||||||
| 69<\/td>\n | Figure H.2 \u2013 Procedure for TRL calibration <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Methods of measurement of the suppression characteristics of passive EMC filtering devices<\/b><\/p>\n |