\n\n| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n |
\n| 4<\/td>\n | European foreword
Endorsement notice <\/td>\n<\/tr>\n |
\n| 7<\/td>\n | English
CONTENTS <\/td>\n<\/tr>\n |
\n| 14<\/td>\n | FOREWORD <\/td>\n<\/tr>\n |
\n| 16<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n |
\n| 18<\/td>\n | 1 General
1.1 Scope
1.2 Normative references <\/td>\n<\/tr>\n |
\n| 20<\/td>\n | 2 Technical data
2.1 Symbols, units and abbreviated terms
2.1.1 General
2.1.2 Letter symbols <\/td>\n<\/tr>\n |
\n| 21<\/td>\n | 2.1.3 Abbreviations
2.2 Terms and definitions <\/td>\n<\/tr>\n |
\n| 26<\/td>\n | 2.3 Preferred values and additional technical requirements
2.3.1 General
2.3.2 Preferred values of nominal capacitance
2.3.3 Preferred values of rated voltage
2.3.4 Rated a.c. load <\/td>\n<\/tr>\n |
\n| 27<\/td>\n | 2.3.5 Rated pulse load
2.3.6 Temperature derated voltage
Figures
Figure 1 \u2013 Reactive power against frequency <\/td>\n<\/tr>\n |
\n| 28<\/td>\n | 2.4 Marking
2.4.1 General
2.4.2 Coding
3 Quality assessment procedures
Figure 2 \u2013 Relation between category temperature range and applied voltage <\/td>\n<\/tr>\n |
\n| 29<\/td>\n | 4 Tests and measurement procedures <\/td>\n<\/tr>\n |
\n| 30<\/td>\n | 4.1 General
4.2 Standard atmospheric conditions
4.2.1 Standard atmospheric conditions for testing
4.2.2 Recovery conditions <\/td>\n<\/tr>\n |
\n| 31<\/td>\n | 4.2.3 Referee conditions
4.2.4 Reference conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.4.1 Visual examination
4.4.2 Dimensions (gauging)
4.4.3 Dimensions (detail)
Tables
Table 1 \u2013 Referee conditions <\/td>\n<\/tr>\n |
\n| 32<\/td>\n | 4.5 Insulation resistance
4.5.1 Preconditioning
4.5.2 Measuring conditions
4.5.3 Test points
4.5.4 Test methods
Table 2 \u2013 Measurement of insulation resistance <\/td>\n<\/tr>\n |
\n| 33<\/td>\n | 4.5.5 Temperature compensation
4.5.6 Conditions to be prescribed in the relevant specification <\/td>\n<\/tr>\n |
\n| 34<\/td>\n | 4.6 Voltage proof
4.6.1 General
4.6.2 Test circuit (for the test between terminations)
Table\u00a03 \u2013 Measuring points <\/td>\n<\/tr>\n |
\n| 35<\/td>\n | 4.6.3 Test
Figure 3 \u2013 Voltage-proof test circuit <\/td>\n<\/tr>\n |
\n| 37<\/td>\n | 4.6.4 Requirements
4.6.5 Conditions to be prescribed in the relevant specification
4.7 Capacitance
4.7.1 Measuring frequency and measuring voltage <\/td>\n<\/tr>\n |
\n| 38<\/td>\n | 4.7.2 Measuring equipment
4.7.3 Conditions to be prescribed in the relevant specification
4.8 Tangent of loss angle and equivalent series resistance (ESR)
4.8.1 Tangent of loss angle
4.8.2 Equivalent series resistance (ESR) <\/td>\n<\/tr>\n |
\n| 39<\/td>\n | 4.9 Leakage current
4.9.1 Preconditioning
4.9.2 Test method
4.9.3 Power source
4.9.4 Measuring accuracy
4.9.5 Test circuit
4.9.6 Conditions to be prescribed in the relevant specification
4.10 Impedance <\/td>\n<\/tr>\n |
\n| 40<\/td>\n | 4.11 Selfresonant frequency and inductance
4.11.1 Self-resonant frequency (fr)
Figure 4 \u2013 Schematic diagram of the impedance measuring circuit <\/td>\n<\/tr>\n |
\n| 41<\/td>\n | Figure 5 \u2013 Capacitor mounting arrangement <\/td>\n<\/tr>\n |
\n| 42<\/td>\n | Figure 6 \u2013 Capacitor mounting arrangement
Figure\u00a07 \u2013 Typical diagram of an absorption oscillator-wavemeter <\/td>\n<\/tr>\n |
\n| 43<\/td>\n | 4.11.2 Inductance
4.11.3 Conditions to be prescribed in the relevant specification
4.12 Outer foil termination
Figure 8 \u2013 Schematic diagram of the measuring circuit <\/td>\n<\/tr>\n |
\n| 44<\/td>\n | 4.13 Robustness of terminations
4.13.1 General
4.13.2 Test Ua1 \u2013 Tensile
Figure 9 \u2013 Test circuit <\/td>\n<\/tr>\n |
\n| 45<\/td>\n | 4.13.3 Test Ub \u2013 Bending (half of the sample)
4.13.4 Test Uc \u2013 Torsion (remaining sample)
4.13.5 Test Ud \u2013 Torque
4.13.6 Visual examination
Table 4 \u2013 Tensile force
Table 5 \u2013 Torque <\/td>\n<\/tr>\n |
\n| 46<\/td>\n | 4.14 Resistance to soldering heat
4.14.1 Preconditioning and initial measurement
4.14.2 Test procedure
4.14.3 Recovery
4.14.4 Final inspection, measurement and requirements
4.15 Solderability
4.15.1 General
4.15.2 Preconditioning <\/td>\n<\/tr>\n |
\n| 47<\/td>\n | 4.15.3 Test procedure
4.15.4 Final inspection, measurements and requirements
4.16 Rapid change of temperature
4.16.1 Initial measurement
4.16.2 Test procedure
4.16.3 Final inspection, measurements and requirements
4.17 Vibration
4.17.1 Initial measurement <\/td>\n<\/tr>\n |
\n| 48<\/td>\n | 4.17.2 Test procedure
4.17.3 Electrical test (intermediate measurement)
4.17.4 Final inspection, measurements and requirements
4.18 Bump (repetitive shock)
4.18.1 Initial measurement
4.18.2 Test procedure
4.18.3 Final inspection, measurements and requirements
4.19 Shock
4.19.1 Initial measurement
4.19.2 Test procedure <\/td>\n<\/tr>\n |
\n| 49<\/td>\n | 4.19.3 Final inspection, measurements and requirements
4.20 Container sealing
4.21 Climatic sequence
4.21.1 General
4.21.2 Initial measurements
4.21.3 Dry heat
4.21.4 Damp heat, cyclic, Test Db, first cycle
4.21.5 Cold <\/td>\n<\/tr>\n |
\n| 50<\/td>\n | 4.21.6 Low air pressure
4.21.7 Damp heat, cyclic, Test Db, remaining cycles
4.21.8 Final measurements
4.22 Damp heat, steady state
4.22.1 Initial measurement
4.22.2 Test procedure
Table 6 \u2013 Number of cycles <\/td>\n<\/tr>\n |
\n| 51<\/td>\n | 4.22.3 Final inspection, measurements and requirements
4.23 Endurance
4.23.1 Initial measurements
4.23.2 Test procedure
4.23.3 Conditions to be prescribed in the relevant specification
4.23.4 Test voltage <\/td>\n<\/tr>\n |
\n| 52<\/td>\n | 4.23.5 Placement in the test chamber
4.23.6 Recovery
4.23.7 Final inspection, measurements and requirements
Figure 10 \u2013 Test circuit for electrolytic capacitors <\/td>\n<\/tr>\n |
\n| 53<\/td>\n | 4.24 Variation of capacitance with temperature
4.24.1 Static method
4.24.2 Dynamic method <\/td>\n<\/tr>\n |
\n| 54<\/td>\n | 4.24.3 Methods of calculation <\/td>\n<\/tr>\n |
\n| 55<\/td>\n | 4.25 Storage
4.25.1 Storage at high temperature
4.25.2 Storage at low temperature <\/td>\n<\/tr>\n |
\n| 56<\/td>\n | 4.26 Surge
4.26.1 Initial measurement
4.26.2 Test procedure
Figure 11 \u2013 Relay circuit
Figure 12 \u2013 Thyristor circuit <\/td>\n<\/tr>\n |
\n| 57<\/td>\n | 4.26.3 Final inspection, measurements and requirements
4.26.4 Information to be given in the relevant detail specification
4.27 Charge and discharge tests and inrush current test
4.27.1 Initial measurement
4.27.2 Test procedure
Figure 13 \u2013 Voltage waveform across capacitor <\/td>\n<\/tr>\n |
\n| 58<\/td>\n | 4.27.3 Charge and discharge
Figure 14 \u2013 Voltage and current waveform <\/td>\n<\/tr>\n |
\n| 59<\/td>\n | 4.27.4 Inrush current
4.27.5 Final inspection, measurements and requirements
4.28 Pressure relief (for aluminium electrolytic capacitors)
4.28.1 General
4.28.2 AC test
4.28.3 DC test
4.28.4 Pneumatic test
4.28.5 Final inspection, measurements and requirements
4.29 Characteristics at high and low temperature
4.29.1 Test procedure <\/td>\n<\/tr>\n |
\n| 60<\/td>\n | 4.29.2 Requirements
4.30 Thermal stability test
4.31 Component solvent resistance
4.31.1 Initial measurements
4.31.2 Test procedure
4.31.3 Final inspection, measurements and requirements
4.32 Solvent resistance of marking
4.32.1 Test procedure <\/td>\n<\/tr>\n |
\n| 61<\/td>\n | 4.32.2 Final inspection, measurements and requirements
4.33 Mounting (for surface mount capacitors only)
4.33.1 Substrate
4.33.2 Wave soldering
4.33.3 Reflow soldering <\/td>\n<\/tr>\n |
\n| 63<\/td>\n | Figure 15 \u2013 Suitable substrate for mechanical tests <\/td>\n<\/tr>\n |
\n| 64<\/td>\n | 4.34 Shear test
4.34.1 Test procedure
4.34.2 Final inspection, measurements and requirements
4.35 Substrate bending test
4.35.1 Test procedure
Figure 16 \u2013 Suitable substrate for electrical tests <\/td>\n<\/tr>\n |
\n| 65<\/td>\n | 4.35.2 Recovery
4.35.3 Final inspection and requirements
4.36 Dielectric absorption
4.36.1 Test procedure <\/td>\n<\/tr>\n |
\n| 66<\/td>\n | 4.36.2 Requirement
4.37 Damp heat, steady state, accelerated
4.37.1 Initial measurements
4.37.2 Test methods
4.37.3 Test procedures
4.37.4 Final inspection, measurements and requirements
4.38 Passive flammability
4.38.1 Test procedure <\/td>\n<\/tr>\n |
\n| 67<\/td>\n | 4.38.2 Final inspection, measurements and requirements
4.39 High surge current test
4.39.1 Initial measurements
4.39.2 Test procedure
Table 7 \u2013 Severities and requirements <\/td>\n<\/tr>\n |
\n| 68<\/td>\n | 4.39.3 Requirements for the charging circuit
4.39.4 Nonconforming items
4.40 Voltage transient overload (for aluminium electrolytic capacitors with non-solid electrolyte)
4.40.1 Initial measurement
4.40.2 Test procedure
Figure 17 \u2013 High surge current test <\/td>\n<\/tr>\n |
\n| 69<\/td>\n | Figure 18 \u2013 Voltage transient overload test circuit <\/td>\n<\/tr>\n |
\n| 70<\/td>\n | 4.40.3 Final inspection, measurements and requirements
4.40.4 Conditions to be prescribed in the relevant specification
4.41 Whisker growth test
4.41.1 General
Figure 19 \u2013 Voltage waveform <\/td>\n<\/tr>\n |
\n| 71<\/td>\n | 4.41.2 Preparation of specimen
4.41.3 Initial measurement
4.41.4 Test procedures
4.41.5 Test severities
4.41.6 Final inspection, measurements and requirements <\/td>\n<\/tr>\n |
\n| 72<\/td>\n | Annexes
Annex A (informative) Interpretation of sampling plans and procedures as described in IEC 60410 for use within quality assessment systems <\/td>\n<\/tr>\n |
\n| 73<\/td>\n | Annex B (informative) Rules for the preparation of detail specifications for capacitors and resistors for electronic equipment for use within quality assessment systems
B.1 Drafting
B.2 Reference standard
B.3 Circulation <\/td>\n<\/tr>\n |
\n| 74<\/td>\n | Annex C (informative) Layout of the first page of a PCP\/CQC specification <\/td>\n<\/tr>\n |
\n| 75<\/td>\n | Annex D (informative) Requirements for capability approval test report
D.1 General
D.2 Requirements
D.3 Summary of test information (for each CQC)
D.4 Measurement record <\/td>\n<\/tr>\n |
\n| 76<\/td>\n | Annex E (informative) Guide for pulse testing of capacitors
E.1 Overview
E.2 Typical capacitor pulse conditions <\/td>\n<\/tr>\n |
\n| 77<\/td>\n | E.3 Effect of inductance on pulse testing <\/td>\n<\/tr>\n |
\n| 79<\/td>\n | Annex F (informative) Guidance for the extension of endurance tests on fixed capacitors
F.1 Overview
F.2 Guidelines <\/td>\n<\/tr>\n |
\n| 80<\/td>\n | Annex G (normative) Damp heat, steady state with voltage applied, for metallized film capacitors only
G.1 Overview
G.2 Test procedure <\/td>\n<\/tr>\n |
\n| 81<\/td>\n | Annex H (normative) Accelerated damp heat, steady state, for multilayer ceramic capacitors only
H.1 Mounting of capacitors
H.2 Initial measurement
H.3 Test procedure
H.4 Recovery
H.5 Final inspection, measurements and requirements <\/td>\n<\/tr>\n |
\n| 82<\/td>\n | Annex Q (informative) Quality assessment procedures
Q.1 General
Q.1.1 Scope of this annex <\/td>\n<\/tr>\n |
\n| 83<\/td>\n | Q.1.2 Quality assessment definitions
Q.1.3 Rework <\/td>\n<\/tr>\n |
\n| 84<\/td>\n | Q.1.4 Alternative test methods
Q.1.5 Certified test records of released lots
Q.1.6 Unchecked parameters
Q.1.7 Delayed delivery
Q.1.8 Repair <\/td>\n<\/tr>\n |
\n| 85<\/td>\n | Q.1.9 Registration of approvals
Q.1.10 Manufacture outside the geographical limits
Q.2 Qualification approval (QA) procedures
Q.2.1 Eligibility for qualification approval
Q.2.2 Application for qualification approval
Q.2.3 Subcontracting
Q.2.4 Test procedure for the initial product qualification approval
Q.2.5 Granting of qualification approval <\/td>\n<\/tr>\n |
\n| 86<\/td>\n | Q.2.6 Maintenance of qualification approval
Q.2.7 Quality conformance inspection
Q.3 Capability approval (CA) procedures
Q.3.1 General
Q.3.2 Eligibility for capability approval <\/td>\n<\/tr>\n |
\n| 87<\/td>\n | Q.3.3 Application for capability approval
Q.3.4 Subcontracting
Q.3.5 Description of the capability
Q.3.6 Demonstration and verification of capability
Q.3.7 Granting of capability approval
Q.3.8 Maintenance of capability approval
Q.3.9 Quality conformance inspection <\/td>\n<\/tr>\n |
\n| 88<\/td>\n | Q.4 Technology approval (TA) procedure
Q.4.1 General
Q.4.2 Eligibility for technology approval
Q.4.3 Application of technology approval
Q.4.4 Subcontracting
Q.4.5 Description of technology
Q.4.6 Demonstration and verification of the technology <\/td>\n<\/tr>\n |
\n| 89<\/td>\n | Q.4.7 Granting of technology approval
Q.4.8 Maintenance of technology approval
Q.4.9 Quality conformance inspection <\/td>\n<\/tr>\n |
\n| 90<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Fixed capacitors for use in electronic equipment – Generic specification<\/b><\/p>\n\n\n\n| Published By<\/td>\n | Publication Date<\/td>\n | Number of Pages<\/td>\n<\/tr>\n | \n| BSI<\/b><\/a><\/td>\n | 2016<\/td>\n | 92<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":231041,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[564,2641],"product_tag":[],"class_list":{"0":"post-231035","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-060-10","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/231035","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/231041"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=231035"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=231035"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=231035"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}} | |