IEC 62373-1:2020
$43.55
Dispositifs à semiconducteurs – Essai de stabilité de température en polarisation pour transistors à effet de champ métal-oxyde-semiconducteur (MOSFET) – Partie 1: Essai rapide de BTI pour les MOSFET
| Published By | Publication Date | Number of Pages |
| IEC | 2020-07-15 | 48 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2020-07-15 |
| Pages Count | 48 |
| Language | France |
| Edition | 1.0 |
| File Size | 1.9 MB |
| ICS Codes | 31.080.30 - Transistors |
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