EIA 970-2013
$9.75
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
| Published By | Publication Date | Number of Pages |
| ECIA | 2013 | 26 |
This test method is used to measure the S parameters of
low-inductance multilayer ceramic capacitors when mounted in shunt
on a probeable low inductance test fixture.
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