BSI 19/30394481 DC:2019 Edition
$13.70
BS EN IEC 60749-30. Semiconductor devices. Mechanical and climatic test methods – Part 30. Preconditioning of non-hermetic surface mount devices prior to reliability testing
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 15 |
| Status | Definitive |
|---|---|
| Pages | 15 |
| Publication Date | 2019-05-28 |
| Standard Number | 19/30394481 DC |
| Title | BS EN IEC 60749-30. Semiconductor devices. Mechanical and climatic test methods – Part 30. Preconditioning of non-hermetic surface mount devices prior to reliability testing |
| Identical National Standard Of | 47/2562/CDV |
| Descriptors | Semiconductor devices, Electronic equipment and components, Mechanical testing, Performance testing, Specimen preparation, Environmental testing, Reliability, Climate, Surface mounting devices, Integrated circuits |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
