UNE-EN 60749-4:2017
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Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Published By | Publication Date | Number of Pages |
AENOR | 2017-07-01 | 19 |
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Published Code | AENOR |
---|---|
Published By | Asociación Española de Normalización |
Publication Date | 2017-07-01 |
Pages Count | 19 |
Language | English |
File Size | 2.1 MB |
ICS Codes | 31.080.01 - Semiconductor devices in general |
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