{"id":55387,"date":"2024-10-17T09:53:05","date_gmt":"2024-10-17T09:53:05","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e1855-3\/"},"modified":"2024-10-24T17:09:08","modified_gmt":"2024-10-24T17:09:08","slug":"astm-e1855-3","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e1855-3\/","title":{"rendered":"ASTM-E1855"},"content":{"rendered":"<\/p>\n

1.1 This test method covers the use of 2N2222A silicon bipolar transistors as dosimetry sensors in the determination of neutron energy spectra, and as silicon 1-MeV equivalent displacement damage fluence monitors.<\/p>\n

1.2 The neutron displacement damage is especially valuable as a spectrum sensor in the range 0.1 to 2.0 MeV when fission foils are not available. It has been applied in the fluence range between 2 X 10 12<\/sup> n\/cm 2<\/sup> and 1 X 10 14<\/sup> n\/cm 2<\/sup> and should be useful up to 10 15<\/sup> n\/cm 2<\/sup> . This test method details the steps for the acquisition and use of silicon 1-MeV equivalent fluence information (in a manner similar to the use of activation foil data) for the determination of neutron spectra.<\/p>\n

1.3 In addition, this sensor can provide important confirmation of neutron spectra determined with other sensors, and yields a direct measurement of the silicon 1-MeV fluence by the transfer technique.<\/p>\n

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nScope
Referenced Documents
Terminology
Summary of Test Method <\/td>\n<\/tr>\n
2<\/td>\nSignificance and Use
Apparatus
FIG. 1 <\/td>\n<\/tr>\n
3<\/td>\nDescription of the Test Method
Experimental Procedure
FIG. 2 <\/td>\n<\/tr>\n
6<\/td>\nUse of
as a Spectrum Sensor Response
Precision and Bias <\/td>\n<\/tr>\n
7<\/td>\nKeywords
X1. ERROR AMPLIFICATION
X1.1
X1.2 <\/td>\n<\/tr>\n
8<\/td>\nX2. SAMPLE DATA SHEET
X2.1
X2.2
FIG. X1.1 <\/td>\n<\/tr>\n
9<\/td>\nX2.3
REFERENCES <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

E1855-05e1 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASTM<\/b><\/a><\/td>\n2005<\/td>\n10<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":55388,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2637],"product_tag":[],"class_list":{"0":"post-55387","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-astm","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/55387","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/55388"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=55387"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=55387"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=55387"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}