{"id":403346,"date":"2024-10-20T05:05:41","date_gmt":"2024-10-20T05:05:41","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-60444-62021-tc\/"},"modified":"2024-10-26T09:04:48","modified_gmt":"2024-10-26T09:04:48","slug":"bs-en-iec-60444-62021-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-60444-62021-tc\/","title":{"rendered":"BS EN IEC 60444-6:2021 – TC"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | 30454869 <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | A-30406253 <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 DLD effects 4.1 Reversible changes in frequency and resistance <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | 4.2 Irreversible changes in frequency and resistance 4.3 Causes of DLD effects 5 Drive levels for DLD measurement <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | 6 Test methods 6.1 Method A (fast standard measurement method) 6.1.1 Testing at two drive levels <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | 6.1.2 Testing according to specification Figure 1 \u2013 Maximum tolerable resistance ratio for the drive level dependence as a function of the resistances or <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | 6.2 Method B (Multi-level reference measurement method) <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | Annex A (normative) Relationship between electrical drive level and mechanical displacement of quartz crystal units <\/td>\n<\/tr>\n | ||||||
56<\/td>\n | Annex B (normative) Method C: DLD measurement with oscillation circuit Figure B.1 \u2013 Insertion of a quartz crystal unit in an oscillator <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | Figure B.2 \u2013 Crystal unit loss resistance as a function of dissipated power <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | Figure B.3 \u2013 Behaviour of the of a quartz crystal unit Figure B.4 \u2013 Block diagram of circuit system <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | Figure B.5 \u2013 Installed in scanned drive level range Figure B.6 \u2013 Drive level behaviour of a quartz crystal unit if \u2212Rosc = 70 \u03a9 is used as test limit in the Annex B test <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | Figure B.7 \u2013 Principal schematic diagram of the go\/no-go test circuit <\/td>\n<\/tr>\n | ||||||
61<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Tracked Changes. Measurement of quartz crystal unit parameters – Measurement of drive level dependence (DLD)<\/b><\/p>\n |