{"id":398399,"date":"2024-10-20T04:35:40","date_gmt":"2024-10-20T04:35:40","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1445-2016-2\/"},"modified":"2024-10-26T08:23:56","modified_gmt":"2024-10-26T08:23:56","slug":"ieee-1445-2016-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1445-2016-2\/","title":{"rendered":"IEEE 1445-2016"},"content":{"rendered":"
Revision Standard – Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std 1445\u2122-2016 Front cover <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Important Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1.\u2002Overview 1.1\u2002Scope 1.2\u2002Purpose 1.3\u2002General <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 2.\u2002Normative references 3.\u2002Definitions, acronyms and abbreviations 3.1\u2002Definitions <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 3.2\u2002Acronyms and abbreviations <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 4.\u2002Data organization overview of the DTIF standard environment <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 4.1\u2002UUT Model Group <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 4.2\u2002Stimulus and response group <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 4.3\u2002Fault Dictionary Group 4.4\u2002Probe Group <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 5.\u2002File type specifications 5.1\u2002HEADER file type <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5.2\u2002STIMULUS file type <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 5.3\u2002PO_RESPONSE file type <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.4\u2002PI_NAMES file type <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 5.5\u2002PO_NAMES file type <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 5.6\u2002MAIN_MODEL file type <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 5.7\u2002COMPONENT_TYPE file type <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 5.8\u2002USER_NODE file type <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 5.9\u2002INPUT_PIN_NAMES file type 5.10\u2002OUTPUT_PIN_NAMES file type <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 5.11\u2002NEAR_FROMS_POINTERS file type 5.12\u2002NEAR_FROMS file type <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 5.13\u2002EVENT file type <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 5.14\u2002SETTLED_STATE_ONLY file type 5.15\u2002SETTLED_STATE_&_PULSES file type <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 5.16\u2002NODE_SOURCE file type <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 5.17\u2002STEPS file type 5.18\u2002F.D._POPATS file type <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 5.19\u2002F.D._FAULT_SIGNATURES file type <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | 5.20\u2002F.D._PRINT_STRINGS file type <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | 5.21\u2002TRISTATE_FROMS_POINTERS file type 5.22\u2002TRISTATE_FROMS file type <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 5.23\u2002PSEUDOPI_NAMES file type <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | 5.24\u2002TIMING_SETS file type <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | 5.25\u2002TIMING_PER_PATTERN file type <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | 5.26\u2002PHASE_CONNECTIONS file type <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | 5.27\u2002AUXILIARY_PIN_NAMES file type <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | 5.28\u2002PI_FORMATS file type <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | 5.29\u2002FORMAT_ATTRIBUTES file type <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | 5.30\u2002F.D._CROSS_REFERENCE file type <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | 5.31\u2002PROBETAG_DEFINITIONS file type <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | 5.32\u2002PROBETAG_ASSIGNMENTS file type <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | 5.33\u2002BURSTS file type 5.34\u2002STIMULUS_TEXT file type <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | 5.35\u2002NODE_NAMES file type <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | 5.36\u2002EVENTS_INIT file type <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | 5.37\u2002EQUIV_FAULTS file type <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | 5.38\u2002PROBE_DETECTION file type <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | 5.39\u2002F.D._EQUIV_SETS file type 6.\u2002Conformance <\/td>\n<\/tr>\n | ||||||
56<\/td>\n | 6.1\u2002End-to-end test (e.g., go\/nogo test) 6.2\u2002Fault dictionary diagnostics <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | 6.3\u2002Guided probe diagnostics <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | Annex\u00a0A (informative) IEEE download website material associated with this document <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | Annex\u00a0B (informative) Example of a circuit used in a test simulation <\/td>\n<\/tr>\n | ||||||
63<\/td>\n | Annex\u00a0C (informative) Bibliography <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | Back cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Digital Test Interchange Format (DTIF)<\/b><\/p>\n |