{"id":398399,"date":"2024-10-20T04:35:40","date_gmt":"2024-10-20T04:35:40","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1445-2016-2\/"},"modified":"2024-10-26T08:23:56","modified_gmt":"2024-10-26T08:23:56","slug":"ieee-1445-2016-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1445-2016-2\/","title":{"rendered":"IEEE 1445-2016"},"content":{"rendered":"

Revision Standard – Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1445\u2122-2016 Front cover <\/td>\n<\/tr>\n
2<\/td>\nTitle page <\/td>\n<\/tr>\n
4<\/td>\nImportant Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n
7<\/td>\nParticipants <\/td>\n<\/tr>\n
8<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\nContents <\/td>\n<\/tr>\n
11<\/td>\n1.\u2002Overview
1.1\u2002Scope
1.2\u2002Purpose
1.3\u2002General <\/td>\n<\/tr>\n
12<\/td>\n2.\u2002Normative references
3.\u2002Definitions, acronyms and abbreviations
3.1\u2002Definitions <\/td>\n<\/tr>\n
14<\/td>\n3.2\u2002Acronyms and abbreviations <\/td>\n<\/tr>\n
15<\/td>\n4.\u2002Data organization overview of the DTIF standard environment <\/td>\n<\/tr>\n
16<\/td>\n4.1\u2002UUT Model Group <\/td>\n<\/tr>\n
17<\/td>\n4.2\u2002Stimulus and response group <\/td>\n<\/tr>\n
18<\/td>\n4.3\u2002Fault Dictionary Group
4.4\u2002Probe Group <\/td>\n<\/tr>\n
19<\/td>\n5.\u2002File type specifications
5.1\u2002HEADER file type <\/td>\n<\/tr>\n
20<\/td>\n5.2\u2002STIMULUS file type <\/td>\n<\/tr>\n
21<\/td>\n5.3\u2002PO_RESPONSE file type <\/td>\n<\/tr>\n
22<\/td>\n5.4\u2002PI_NAMES file type <\/td>\n<\/tr>\n
23<\/td>\n5.5\u2002PO_NAMES file type <\/td>\n<\/tr>\n
24<\/td>\n5.6\u2002MAIN_MODEL file type <\/td>\n<\/tr>\n
25<\/td>\n5.7\u2002COMPONENT_TYPE file type <\/td>\n<\/tr>\n
27<\/td>\n5.8\u2002USER_NODE file type <\/td>\n<\/tr>\n
28<\/td>\n5.9\u2002INPUT_PIN_NAMES file type
5.10\u2002OUTPUT_PIN_NAMES file type <\/td>\n<\/tr>\n
29<\/td>\n5.11\u2002NEAR_FROMS_POINTERS file type
5.12\u2002NEAR_FROMS file type <\/td>\n<\/tr>\n
30<\/td>\n5.13\u2002EVENT file type <\/td>\n<\/tr>\n
32<\/td>\n5.14\u2002SETTLED_STATE_ONLY file type
5.15\u2002SETTLED_STATE_&_PULSES file type <\/td>\n<\/tr>\n
34<\/td>\n5.16\u2002NODE_SOURCE file type <\/td>\n<\/tr>\n
35<\/td>\n5.17\u2002STEPS file type
5.18\u2002F.D._POPATS file type <\/td>\n<\/tr>\n
36<\/td>\n5.19\u2002F.D._FAULT_SIGNATURES file type <\/td>\n<\/tr>\n
38<\/td>\n5.20\u2002F.D._PRINT_STRINGS file type <\/td>\n<\/tr>\n
39<\/td>\n5.21\u2002TRISTATE_FROMS_POINTERS file type
5.22\u2002TRISTATE_FROMS file type <\/td>\n<\/tr>\n
40<\/td>\n5.23\u2002PSEUDOPI_NAMES file type <\/td>\n<\/tr>\n
41<\/td>\n5.24\u2002TIMING_SETS file type <\/td>\n<\/tr>\n
42<\/td>\n5.25\u2002TIMING_PER_PATTERN file type <\/td>\n<\/tr>\n
43<\/td>\n5.26\u2002PHASE_CONNECTIONS file type <\/td>\n<\/tr>\n
44<\/td>\n5.27\u2002AUXILIARY_PIN_NAMES file type <\/td>\n<\/tr>\n
45<\/td>\n5.28\u2002PI_FORMATS file type <\/td>\n<\/tr>\n
46<\/td>\n5.29\u2002FORMAT_ATTRIBUTES file type <\/td>\n<\/tr>\n
47<\/td>\n5.30\u2002F.D._CROSS_REFERENCE file type <\/td>\n<\/tr>\n
48<\/td>\n5.31\u2002PROBETAG_DEFINITIONS file type <\/td>\n<\/tr>\n
49<\/td>\n5.32\u2002PROBETAG_ASSIGNMENTS file type <\/td>\n<\/tr>\n
50<\/td>\n5.33\u2002BURSTS file type
5.34\u2002STIMULUS_TEXT file type <\/td>\n<\/tr>\n
51<\/td>\n5.35\u2002NODE_NAMES file type <\/td>\n<\/tr>\n
52<\/td>\n5.36\u2002EVENTS_INIT file type <\/td>\n<\/tr>\n
53<\/td>\n5.37\u2002EQUIV_FAULTS file type <\/td>\n<\/tr>\n
54<\/td>\n5.38\u2002PROBE_DETECTION file type <\/td>\n<\/tr>\n
55<\/td>\n5.39\u2002F.D._EQUIV_SETS file type
6.\u2002Conformance <\/td>\n<\/tr>\n
56<\/td>\n6.1\u2002End-to-end test (e.g., go\/nogo test)
6.2\u2002Fault dictionary diagnostics <\/td>\n<\/tr>\n
57<\/td>\n6.3\u2002Guided probe diagnostics <\/td>\n<\/tr>\n
59<\/td>\nAnnex\u00a0A (informative) IEEE download website material associated with this document <\/td>\n<\/tr>\n
60<\/td>\nAnnex\u00a0B (informative) Example of a circuit used in a test simulation <\/td>\n<\/tr>\n
63<\/td>\nAnnex\u00a0C (informative) Bibliography <\/td>\n<\/tr>\n
64<\/td>\nBack cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Digital Test Interchange Format (DTIF)<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2016<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":398402,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-398399","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/398399","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/398402"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=398399"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=398399"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=398399"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}