{"id":396943,"date":"2024-10-20T04:27:29","date_gmt":"2024-10-20T04:27:29","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1309-2005-2\/"},"modified":"2024-10-26T08:14:56","modified_gmt":"2024-10-26T08:14:56","slug":"ieee-1309-2005-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1309-2005-2\/","title":{"rendered":"IEEE 1309-2005"},"content":{"rendered":"

Revision Standard – Superseded. Consensus calibration methods for electromagnetic (EM) field sensors and probes are provided. Data recording and reporting requirements are given, and a method for determining uncertainty is specified.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nFront Cover <\/td>\n<\/tr>\n
3<\/td>\nIEEE Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding Antennas, from 9 kHz to 40 GHz <\/td>\n<\/tr>\n
5<\/td>\nIntroduction
Notice to users
Errata
Interpretations
Patents
Participants <\/td>\n<\/tr>\n
7<\/td>\nContents <\/td>\n<\/tr>\n
11<\/td>\nIEEE Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding Antennas, from 9 kHz to 40 GHz
1. Overview
1.1 Scope <\/td>\n<\/tr>\n
12<\/td>\n1.2 Purpose
1.3 Background
1.4 Grades of calibration <\/td>\n<\/tr>\n
13<\/td>\n1.5 Generic probe types <\/td>\n<\/tr>\n
14<\/td>\n2. Normative references <\/td>\n<\/tr>\n
15<\/td>\n3. Definitions <\/td>\n<\/tr>\n
17<\/td>\n4. Measurement methods
4.1 Calibration methods <\/td>\n<\/tr>\n
18<\/td>\n4.2 Field sensor or probe orientation during frequency domain calibration
4.2.1 Directional and positional effects
4.2.2 Calibration data collection <\/td>\n<\/tr>\n
20<\/td>\n4.3 Field probe or sensor orientation during time domain calibration
5. Standard field generation methods <\/td>\n<\/tr>\n
22<\/td>\n6. Calibration uncertainty
6.1 Standard uncertainty <\/td>\n<\/tr>\n
23<\/td>\n6.2 Combined standard uncertainty
6.3 Expanded uncertainty
6.4 Reporting uncertainty
7. Characteristics to be measured
7.1 Frequency domain calibration parameters
7.1.1 Dynamic range and amplitude calibration levels <\/td>\n<\/tr>\n
24<\/td>\n7.1.2 Frequency response
7.1.3 Isotropy <\/td>\n<\/tr>\n
25<\/td>\n7.1.4 Response time (optional)
7.1.5 Time constant (optional) <\/td>\n<\/tr>\n
26<\/td>\n7.1.6 Modulation (optional)
7.2 Time domain calibration parameters
7.2.1 Amplitude <\/td>\n<\/tr>\n
27<\/td>\n7.2.2 Dynamic range
7.2.3 Rise time
7.2.4 Fall time (droop)
7.2.5 Overshoot and ringing
8. Procedures (measurement techniques) <\/td>\n<\/tr>\n
28<\/td>\n8.1 Transfer standard sensors and probes
8.2 Working standard sensors and probes <\/td>\n<\/tr>\n
29<\/td>\n8.3 Frequency domain calibration procedure
8.3.1 Lead and cable effects
8.3.2 Frequency domain measurement procedures <\/td>\n<\/tr>\n
31<\/td>\n8.3.3 Response time measurement procedure <\/td>\n<\/tr>\n
32<\/td>\n8.3.4 Field sensor or probe time constant measurement procedure
8.4 Time domain calibration procedure <\/td>\n<\/tr>\n
33<\/td>\n8.4.1 Amplitude
8.4.2 Dynamic range and amplitude calibration levels
8.4.3 Rise time
8.4.4 Fall time (droop) <\/td>\n<\/tr>\n
34<\/td>\n8.4.5 Overshoot and ringing
9. Documentation
9.1 Proper documentation
9.2 Test documentation
9.3 Calibration interval
9.4 Out-of-tolerance notification
9.5 Certification to client or end user <\/td>\n<\/tr>\n
36<\/td>\nAnnex A (normative) Grades of calibration
A.1 Grades of calibration
A.1.1 Calibration type
A.1.2 Minimum number of frequencies (frequency response) <\/td>\n<\/tr>\n
39<\/td>\nA.1.3 Minimum number of field levels (dynamic range)
A.1.4 Isotropy <\/td>\n<\/tr>\n
40<\/td>\nA.1.5 Response time (optional) <\/td>\n<\/tr>\n
41<\/td>\nA.1.6 Time constant (optional)
A.1.7 Modulation (optional)
A.1.8 Illumination (immersion) conditions
A.2 Grades of calibration notation summary <\/td>\n<\/tr>\n
42<\/td>\nA.3 Application cautions and examples <\/td>\n<\/tr>\n
43<\/td>\nA.3.1 Grades of calibration – Example 1 <\/td>\n<\/tr>\n
44<\/td>\nA.3.2 Grades of calibration – Example 2 <\/td>\n<\/tr>\n
47<\/td>\nAnnex B (normative) Field generation setups and calculation methods
B.1 Electric and magnetic field generation using TEM cell, 9 kHz-200 MHz <\/td>\n<\/tr>\n
48<\/td>\nB.1.1 TEM cell electrical characteristics <\/td>\n<\/tr>\n
49<\/td>\nB.1.2 Higher order modes and standing waves <\/td>\n<\/tr>\n
50<\/td>\nB.1.3 Probe sensor size with respect to plate separation
B.1.4 Power measurement stability <\/td>\n<\/tr>\n
51<\/td>\nB.1.5 TEM cell operated with termination impedance different from 50 W
B.1.6 Absorber-loaded TEM cells
B.2 Magnetic field generation using Helmholtz coils, 9 kHz-10 MHz
B.2.1 Introduction <\/td>\n<\/tr>\n
52<\/td>\nB.2.2 Axial field strength accuracy <\/td>\n<\/tr>\n
53<\/td>\nB.2.3 Coil radius and spacing error effects
B.2.4 Coil current and turns errors <\/td>\n<\/tr>\n
54<\/td>\nB.2.5 Calculating radial field strength <\/td>\n<\/tr>\n
55<\/td>\nB.2.6 Determining coil size <\/td>\n<\/tr>\n
56<\/td>\nB.2.7 Maximum frequency of operation <\/td>\n<\/tr>\n
58<\/td>\nB.2.8 Extending the upper frequency limit
B.2.9 Effects of loading
B.2.10 Summary <\/td>\n<\/tr>\n
59<\/td>\nB.3 Open-ended waveguide source in anechoic chamber, 200-450 MHz <\/td>\n<\/tr>\n
60<\/td>\nB.4 Pyramidal horn antenna source in anechoic chamber, 450 MHz-40 GHz
B.4.1 Standard transmitting antenna equations
B.4.2 Measurement of power delivered to a transmitting device <\/td>\n<\/tr>\n
62<\/td>\nB.4.3 Standard field equations for horn antenna in anechoic chamber <\/td>\n<\/tr>\n
64<\/td>\nB.5 Waveguide chamber, 100 MHz-2.6 GHz <\/td>\n<\/tr>\n
65<\/td>\nB.6 GTEM cell, 9 kHz-1 GHz <\/td>\n<\/tr>\n
66<\/td>\nB.7 Parallel plate transmission line <\/td>\n<\/tr>\n
68<\/td>\nB.8 Conical transmission line
B.9 Cone and ground plane <\/td>\n<\/tr>\n
70<\/td>\nAnnex C (informative) Miscellaneous factors affecting probe calibration and use
C.1 Cables <\/td>\n<\/tr>\n
71<\/td>\nC.2 Other parameters
C.2.1 Readout device sampling effects <\/td>\n<\/tr>\n
72<\/td>\nAnnex D (normative) Probe calibrations for typical commercial electronic products radiated immunity test setups
D.1 Introduction
D.2 Probe or sensor calibration requirements
D.2.1 Calibration frequency range
D.2.2 Frequency steps
D.2.3 Field strength <\/td>\n<\/tr>\n
73<\/td>\nD.2.4 Linearity check for probe or sensor <\/td>\n<\/tr>\n
74<\/td>\nD.2.5 Probe isotropic response
D.3 Requirements for probe calibration environments (i.e., FAR)
D.3.1 Power amplifier harmonics and spurious signals <\/td>\n<\/tr>\n
75<\/td>\nD.3.2 FAR site validation tests <\/td>\n<\/tr>\n
76<\/td>\nD.4 Probe or sensor calibration procedures <\/td>\n<\/tr>\n
77<\/td>\nD.4.1 Calibration test setup
D.4.2 Calibration test procedures <\/td>\n<\/tr>\n
86<\/td>\nAnnex E (normative) H-field probe calibrations for ANSI C63.19 testing
E.1 Introduction
E.2 Probe or sensor calibration requirements
E.2.1 Calibration frequency range
E.2.2 Frequency steps
E.2.3 Field strength <\/td>\n<\/tr>\n
87<\/td>\nE.2.4 Linearity check for probe or sensor
E.2.5 Probe isotropic response
E.3 Requirements for probe calibration environments <\/td>\n<\/tr>\n
88<\/td>\nE.3.1 Power amplifier harmonics and spurious signals
E.3.2 GTEM cell validation tests <\/td>\n<\/tr>\n
89<\/td>\nE.4 Probe or sensor calibration procedures
E.4.1 Calibration test setup
E.4.2 Calibration test procedures <\/td>\n<\/tr>\n
92<\/td>\nAnnex F (informative) Deconvolution <\/td>\n<\/tr>\n
94<\/td>\nAnnex G (informative) Burst peak field measurements <\/td>\n<\/tr>\n
96<\/td>\nAnnex H (informative) Estimating uncertainty
H.1 Standard uncertainty
H.1.1 Type A (statistical method) <\/td>\n<\/tr>\n
97<\/td>\nH.1.2 Type B (other methods) <\/td>\n<\/tr>\n
98<\/td>\nH.2 Combined standard uncertainty
H.3 Expanded uncertainty <\/td>\n<\/tr>\n
99<\/td>\nH.4 Reporting uncertainty <\/td>\n<\/tr>\n
100<\/td>\nH.5 Additional uncertainty budget examples <\/td>\n<\/tr>\n
104<\/td>\nAnnex I (informative) Time domain pulse fidelity <\/td>\n<\/tr>\n
106<\/td>\nAnnex J (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding Antennas, from 9 kHz to 40 GHz<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2005<\/td>\n114<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":396948,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-396943","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/396943","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/396948"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=396943"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=396943"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=396943"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}