{"id":255303,"date":"2024-10-19T16:52:35","date_gmt":"2024-10-19T16:52:35","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-62586-22014\/"},"modified":"2024-10-25T12:19:35","modified_gmt":"2024-10-25T12:19:35","slug":"bs-en-62586-22014","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-62586-22014\/","title":{"rendered":"BS EN 62586-2:2014"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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6<\/td>\n | Annex ZZ (informative) Coverage of Essential Requirements of EU Directives Untitled <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions, abbreviations, notations and symbols <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 3.1 General terms and definitions 3.2 Terms and definitions related to uncertainty <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 3.3 Notations 3.3.1 Functions 3.3.2 Symbols and abbreviations 3.3.3 Indices 4 Requirements 4.1 Requirements for products complying with class A <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 4.2 Requirements for products complying with class S Tables Table 1 \u2013 Summary of type tests for Class A <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 5 Functional type tests common requirements 5.1 General philosophy for testing 5.1.1 Measuring ranges Table 2 \u2013 Summary of type tests for Class S Table 3 \u2013 Testing points for each measured parameter <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 5.1.2 Single “power system influence quantities” Table 4 \u2013 List of single “power system influence quantities” <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5.1.3 Mixed “power system influence quantities” measuring range Table 5 \u2013 List of mixed “power system influence quantities” <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 5.1.4 “External influence quantities” 5.1.5 Test criteria Table 6 \u2013 Influence of Temperature Table 7 \u2013 Influence of auxiliary power supply voltage Table 8 \u2013 List of generic test criteria <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.2 Testing procedure 5.2.1 Device under test 5.2.2 Testing conditions 5.2.3 Testing equipment 6 Functional testing procedure for instruments complying with class A according to IEC\u00a061000-4-30 6.1 Power frequency 6.1.1 General 6.1.2 Measurement method <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 6.1.3 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6.1.4 Measurement evaluation 6.1.5 Measurement aggregation 6.2 Magnitude of supply voltage 6.2.1 Measurement method 6.2.2 Measurement uncertainty and measuring range 6.2.3 Measurement evaluation <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 6.2.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 6.3 Flicker 6.4 Supply voltage interruptions, dips and swells 6.4.1 General <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Figures Figure 1 \u2013 Overview of test for dips according to test A4.1.1 <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | Figure 2 \u2013 Detail 1 of waveform for test of dips according to test A4.1.1 Figure 3 \u2013 Detail 2 of waveform for tests of dips according to A4.1.1 Figure 4 \u2013 Detail 3 of waveform for tests of dips according to test A4.1.1 <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | Figure 5 \u2013 Detail 1 of waveform for test of dips according to test A4.1.2 Figure 6 \u2013 Detail 2 of waveform for tests of dips according to test A4.1.2 <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Figure 7 \u2013 Detail 1 of waveform for test of swells according to test A4.1.2 Figure 8 \u2013 Detail 2 of waveform for tests of swells according to test A4.1.2 <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | Figure 9 \u2013 Sliding reference voltage test Figure 10 \u2013 Sliding reference start up condition <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 6.4.2 Check dips \/ interruptions in polyphase system Figure 11 \u2013 Detail 1 of waveform for test of polyphase dips\/interruptions <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | Figure 12 \u2013 Detail 2 of waveform for test of polyphase dips\/interruptions Figure 13 \u2013 Detail 3 of waveform for test of polyphase dips\/interruptions <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 6.4.3 Check swells in polyphase system Figure 14 \u2013 Detail 1 of waveform for test of polyphase swells <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | 6.5 Supply voltage unbalance 6.5.1 General 6.5.2 Measurement method, measurement uncertainty and measuring range Figure 15 \u2013 Detail 2 of waveform for test of polyphase swells <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | 6.5.3 Aggregation 6.6 Voltage harmonics 6.6.1 Measurement method <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | 6.6.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 6.6.3 Measurement evaluation 6.6.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | 6.7 Voltage inter-harmonics 6.7.1 Measurement method 6.7.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | 6.7.3 Measurement evaluation 6.7.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | 6.8 Mains signalling voltages on the supply voltage 6.8.1 Measurement method <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | 6.8.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | 6.8.3 Aggregation 6.9 Measurement of underdeviation and overdeviation parameters 6.9.1 Measurement method <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | 6.9.2 Measurement uncertainty and measuring range 6.9.3 Measurement evaluation 6.9.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | 6.10 Flagging <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | Figure 16 \u2013 Flagging test for class A <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | 6.11 Clock uncertainty testing 6.12 Variations due to external influence quantities 6.12.1 General Figure 17 \u2013 Clock uncertainty testing <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | 6.12.2 Influence of temperature <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | 6.12.3 Influence of power supply voltage <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | 7 Functional testing procedure for instruments complying with class S according to IEC\u00a061000-4-30 7.1 Power frequency 7.1.1 General 7.1.2 Measurement method <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | 7.1.3 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
61<\/td>\n | 7.1.4 Measurement evaluation 7.1.5 Measurement aggregation 7.2 Magnitude of the supply voltage 7.2.1 Measurement method 7.2.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | 7.2.3 Measurement evaluation 7.2.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
63<\/td>\n | 7.3 Flicker 7.4 Supply voltage interruptions, dips and swells 7.4.1 General requirements <\/td>\n<\/tr>\n | ||||||
66<\/td>\n | Figure 18 \u2013 Detail 1 of waveform for test of dips according to test S4.1.2 Figure 19 \u2013 Detail 2 of waveform for tests of dips according to test S4.1.2 <\/td>\n<\/tr>\n | ||||||
67<\/td>\n | Figure 20 \u2013 Detail 1 of waveform for test of swells according to test S4.1.2 Figure 21 \u2013 Detail 2 of waveform for tests of swells according to test S4.1.2 <\/td>\n<\/tr>\n | ||||||
68<\/td>\n | Figure 22 \u2013 Sliding reference voltage test Figure 23 \u2013 Sliding reference start up condition <\/td>\n<\/tr>\n | ||||||
69<\/td>\n | 7.4.2 Check dips \/ interruptions in polyphase system Figure 24 \u2013 Detail 1 of waveform for test of polyphase dips\/interruptions <\/td>\n<\/tr>\n | ||||||
70<\/td>\n | Figure 25 \u2013 Detail 2 of waveform for test of polyphase dips\/interruptions Figure 26 \u2013 Detail 3 of waveform for test of polyphase dips\/interruptions <\/td>\n<\/tr>\n | ||||||
71<\/td>\n | 7.4.3 Check swells in polyphase system Figure 27 \u2013 Detail 1 of waveform for test of polyphase swells <\/td>\n<\/tr>\n | ||||||
72<\/td>\n | 7.5 Supply voltage unbalance 7.5.1 General 7.5.2 Measurement method, measurement uncertainty and measuring range Figure 28 \u2013 Detail 2 of waveform for test of polyphase swells <\/td>\n<\/tr>\n | ||||||
73<\/td>\n | 7.5.3 Aggregation 7.6 Voltage harmonics 7.6.1 General 7.6.2 Measurement method <\/td>\n<\/tr>\n | ||||||
75<\/td>\n | 7.6.3 Measurement method, measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
76<\/td>\n | 7.6.4 Measurement evaluation 7.6.5 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
77<\/td>\n | 7.7 Voltage inter-harmonics <\/td>\n<\/tr>\n | ||||||
78<\/td>\n | 7.8 Mains Signalling Voltages on the supply voltage 7.8.1 General 7.8.2 Measurement method 7.8.3 Measurement uncertainty and measuring range 7.8.4 Aggregation 7.9 Measurement of underdeviation and overdeviation parameters 7.10 Flagging <\/td>\n<\/tr>\n | ||||||
79<\/td>\n | Figure 29 \u2013 Flagging test for class S <\/td>\n<\/tr>\n | ||||||
80<\/td>\n | 7.11 Clock uncertainty testing 7.12 Variations due to external influence quantities 7.12.1 General Figure 30 \u2013 Clock uncertainty testing <\/td>\n<\/tr>\n | ||||||
81<\/td>\n | 7.12.2 Frequency measurement 7.12.3 Influence of temperature <\/td>\n<\/tr>\n | ||||||
82<\/td>\n | 7.12.4 Influence of power supply voltage 8 Calculation of measurement uncertainty and operating uncertainty <\/td>\n<\/tr>\n | ||||||
83<\/td>\n | Table 9 \u2013 Uncertainty requirements <\/td>\n<\/tr>\n | ||||||
84<\/td>\n | Annex A (normative) Intrinsic uncertainty, operating uncertainty, and overall system uncertainty Figure A.1 \u2013 Different kinds of uncertainties <\/td>\n<\/tr>\n | ||||||
86<\/td>\n | Annex B (normative) Calculation of measurement and operating uncertainty for voltage magnitude and power frequency <\/td>\n<\/tr>\n | ||||||
89<\/td>\n | Annex C (informative) Further test on dips (amplitude and phase angles changes) Figure C.1 \u2013 Phase-to-neutral testing on three-phase systems Figure C.2 \u2013 Phase-to-phase testing on three-phase systems <\/td>\n<\/tr>\n | ||||||
90<\/td>\n | Table C.1 \u2013 Tests pattern <\/td>\n<\/tr>\n | ||||||
91<\/td>\n | Annex D (informative) Further tests on dips (polyphase): test procedure <\/td>\n<\/tr>\n | ||||||
92<\/td>\n | Figure D.1 \u2013 Example for on phase of a typical N cycle injection <\/td>\n<\/tr>\n | ||||||
93<\/td>\n | Figure D.2 \u2013 Dip\/interruption accuracy (amplitude and timing) test <\/td>\n<\/tr>\n | ||||||
94<\/td>\n | Figure D.3 \u2013 Swell accuracy (amplitude and timing) test <\/td>\n<\/tr>\n | ||||||
95<\/td>\n | Annex E (normative) Gapless measurements of voltage amplitude and harmonics test <\/td>\n<\/tr>\n | ||||||
98<\/td>\n | Annex F (informative) Gapless measurements of voltage amplitude and harmonics Figure F.1 \u2013 Simulated signal under noisy conditions <\/td>\n<\/tr>\n | ||||||
99<\/td>\n | Figure F.2 \u2013 Waveform for checking gapless RMS voltage measurement Figure F.3 \u2013 2,3\u00a0Hz Frequency fluctuation <\/td>\n<\/tr>\n | ||||||
100<\/td>\n | Figure F.4 \u2013 Spectral leakage effects for a missing sample <\/td>\n<\/tr>\n | ||||||
101<\/td>\n | Figure F.5 \u2013 Illustration of QRMS for missing samples Figure F.6 \u2013 Detection of a single missing sample <\/td>\n<\/tr>\n | ||||||
102<\/td>\n | Figure F.7 \u2013 QRMS for an ideal signal, sampling error = 300\u00a0x\u00a010\u20136 Figure F.8 \u2013 QRMS for an ideal signal, sampling error = 400\u00a0x\u00a010\u20136 <\/td>\n<\/tr>\n | ||||||
103<\/td>\n | Figure F.9 \u2013 QRMS for an ideal signal, sampling error = 200\u00a0x\u00a010\u20136 <\/td>\n<\/tr>\n | ||||||
104<\/td>\n | Figure F.10 \u2013 QRMS with ideal test signal and perfect samplingfrequency synchronization Figure F.11 \u2013 QRMS with 300\u00a0x\u00a010\u20136 sampling frequency error and 100\u00a0x\u00a010\u20136 modulation frequency error <\/td>\n<\/tr>\n | ||||||
105<\/td>\n | Figure F.12 \u2013 QRMS with a 20\/24 cycles sliding window with a output every 10\/12 cycles Figure F.13 \u2013 Amplitude test for fluctuating component <\/td>\n<\/tr>\n | ||||||
106<\/td>\n | Annex G (informative) Testing equipment requirements <\/td>\n<\/tr>\n | ||||||
107<\/td>\n | Annex H (informative) Example of test report <\/td>\n<\/tr>\n | ||||||
108<\/td>\n | Annex I (informative) Mixed influence quantities Table I.1 \u2013 Mixed influence quantities test for frequency Table I.2 \u2013 Mixed influence quantities test for magnitude of voltage <\/td>\n<\/tr>\n | ||||||
109<\/td>\n | Table I.3 \u2013 Mixed influence quantities test for dips and swells <\/td>\n<\/tr>\n | ||||||
110<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Power quality measurement in power supply systems – Functional tests and uncertainty requirements<\/b><\/p>\n |