IEC 61000-4-4:2012 is available as \/2 which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition. IEC 61000-4-4:2012 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It has the status of a basic EMC publication in accordance with IEC Guide 107. It gives immunity requirements and test procedures related to electrical fast transients\/bursts. It additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient\/bursts on supply, signal, control and earth ports. The test method documented in this standard describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This third edition cancels and replaces the second edition published in 2004 and its amendment 1 (2010). It constitutes a technical revision which improves and clarifies simulator specifications, test criteria and test setups.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and abbreviations 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 3.2 Abbreviations 4 General 5 Test levels <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 6 Test equipment 6.1 Overview 6.2 Burst generator 6.2.1 General Tables Table\u00a01 \u2013 Test levels <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 6.2.2 Characteristics of the fast transient\/burst generator Figures Figure 1 \u2013 Simplified circuit diagram showing major elements of a fast transient\/burst generator <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Figure\u00a02 \u2013 Representation of an electrical fast transient\/burst Figure\u00a03 \u2013 Ideal waveform of a single pulse into a 50\u00a0\u2126 load with nominal parameters tr = 5\u00a0ns and tw = 50\u00a0ns <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 6.2.3 Calibration of the characteristics of the fast transient\/burst generator <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 6.3 Coupling\/decoupling network for a.c.\/d.c. power port 6.3.1 Characteristics of the coupling\/decoupling network Table\u00a02 \u2013 Output voltage peak values and repetition frequencies <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 6.3.2 Calibration of the coupling\/decoupling network Figure\u00a04 \u2013 Coupling\/decoupling network for a.c.\/d.c.power mains supply ports\/terminals <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 6.4 Capacitive coupling clamp 6.4.1 General Figure\u00a05 \u2013 Calibration of the waveform at the output of thecoupling\/decoupling network <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 6.4.2 Calibration of the capacitive coupling clamp Figure\u00a06 \u2013 Example of a capacitive coupling clamp <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Figure\u00a07 \u2013 Transducer plate for coupling clamp calibration Figure\u00a08 \u2013 Calibration of a capacitive coupling clamp using the transducer plate <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 7 Test setup 7.1 General 7.2 Test equipment 7.2.1 General 7.2.2 Verification of the test instrumentation Figure\u00a09 \u2013 Block diagram for electrical fast transient\/burst immunity test <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 7.3 Test setup for type tests performed in laboratories 7.3.1 Test conditions Figure\u00a010 \u2013 Example of a verification setup of the capacitive coupling clamp <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Figure\u00a011 \u2013 Example of a test setup for laboratory type tests <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | Figure\u00a012 \u2013 Example of test setup using a floor standing system of two EUTs <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 7.3.2 Methods of coupling the test voltage to the EUT Figure\u00a013 \u2013 Example of a test setup for equipment with elevated cable entries <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | Figure\u00a014 \u2013 Example of a test setup for direct couplingof the test voltage to a.c.\/d.c. power ports for laboratory type tests <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 7.4 Test setup for in situ tests 7.4.1 Overview 7.4.2 Test on power ports and earth ports Figure\u00a015 \u2013 Example for in situ test on a.c.\/d.c. power ports and protective earth terminals for stationary, floor standing EUT <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 7.4.3 Test on signal and control ports Figure 16 \u2013 Example of in situ test on signal and control ports without the capacitive coupling clamp <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 8 Test procedure 8.1 General 8.2 Laboratory reference conditions 8.2.1 Climatic conditions 8.2.2 Electromagnetic conditions 8.3 Execution of the test <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 9 Evaluation of test results 10 Test report <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Annex A (informative) Information on the electrical fast transients <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Annex B (informative) Selection of the test levels <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | Annex C (informative) Measurement uncertainty (MU) considerations <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | Table\u00a0C.1 \u2013 Example of uncertainty budget for voltage rise time (tr) <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | Table\u00a0C.2 \u2013 Example of uncertainty budget for EFT\/B peak voltage value (VP) <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | Table\u00a0C.3 \u2013 Example of uncertainty budget for EFT\/B voltage pulse width (tw) <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | Table\u00a0C.4 \u2013 \u03b1 factor (Equation (C.4)) of different unidirectional impulseresponses corresponding to the same bandwidth of the system B <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Electromagnetic compatibility (EMC) – Testing and measurement techniques. Electrical fast transient\/burst immunity test<\/b><\/p>\n |