This part of EN 61935 specifies reference measurement procedures for cabling parameters and the requirements for field tester accuracy to measure cabling parameters identified in series EN 50173. This standard does not apply to EN 50173-4.<\/p>\n
This International Standard applies when the cable assemblies are constructed of cables complying with the IEC 61156 family of standards, and connecting hardware as specified in IEC 60603-7 family of standards or IEC 61076-3-104 and IEC 61076-3-110. In the case where cables and\/or connectors do not comply with these standards, then additional tests may be required.<\/p>\n
This standard is organized as follows:<\/p>\n
reference laboratory measurement procedures on cabling topologies are specified in Clause 4. In some cases, these procedures may be used in the field;<\/p>\n<\/li>\n
descriptions and requirements for measurements in the field are specified in Clause 5;<\/p>\n<\/li>\n
performance requirements for field testers and procedures to verify performance are specified in Clause 6.<\/p>\n<\/li>\n<\/ul>\n
\nNOTE 1 This standard does not include tests that are normally performed on the cables and connectors separately. These tests are described in IEC 61156-1 and IEC 60603-7 or IEC 61076-3-104 and IEC 61076-3-110 respectively.<\/p>\n
NOTE 2 Wherever possible, cables and connectors used in cable assemblies, even if they are not described in IEC 61156 or IEC 60603-7, IEC 61076-3-104 or IEC 61076-3-110, are tested separately according to the tests given in the relevant generic specification. In this case, most of the environmental and mechanical tests described in this standard may be omitted.<\/p>\n
NOTE 3 Users of this standard are advised to consult with applications standards, equipment manufacturers and system integrators to determine the suitability of these requirements for specific networking applications.<\/p>\n<\/blockquote>\n
This standard relates to performance with respect to 100 \u03a9 cabling. For 120 \u03a9 or 150 \u03a9 cabling, the same principles apply but the measurement system should correspond to the nominal impedance level.<\/p>\n
Field tester types include certification, qualification and verification. Certification testing is performed for the rigorous needs of commercial\/industrial buildings to this standard. Qualification testing is described in IEC 61935-3. Qualification testing determines whether the cabling will support certain network technologies (e.g., 1000BASE-T, 100BASE-TX, IEEE 1394b1)<\/sup>). Qualification testers do not have traceable accuracy to national standards and provide confidence that specific applications will work. Verification testers only verify connectivity.<\/p>\n
Throughout this document, 4-pair cabling is assumed. The test procedures described in this standard may also be used to evaluate 2-pair balanced cabling. However, 2-pair cabling links that share the same sheath with other links are tested as 4-pair cabling.<\/p>\n
PDF Catalog<\/h4>\n
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\n PDF Pages<\/th>\n PDF Title<\/th>\n<\/tr>\n \n 8<\/td>\n CONTENTS <\/td>\n<\/tr>\n \n 14<\/td>\n INTRODUCTION <\/td>\n<\/tr>\n \n 15<\/td>\n 1 Scope <\/td>\n<\/tr>\n \n 16<\/td>\n 2 Normative references <\/td>\n<\/tr>\n \n 17<\/td>\n 3 Terms and definitions <\/td>\n<\/tr>\n \n 19<\/td>\n 4 Reference measurement procedures for electrical properties
4.1 General
4.2 Test equipment considerations <\/td>\n<\/tr>\n\n 20<\/td>\n Figures
Figure 1 \u2013 Resistor load <\/td>\n<\/tr>\n\n 22<\/td>\n Figure\u00a02 \u2013 Reference planes for permanent link and channel <\/td>\n<\/tr>\n \n 23<\/td>\n Figure 3 \u2013 180( hybrid used as a balun <\/td>\n<\/tr>\n \n 24<\/td>\n Tables
Table 1 \u2013 Test balun performance characteristics <\/td>\n<\/tr>\n\n 25<\/td>\n 4.3 DC loop resistance <\/td>\n<\/tr>\n \n 26<\/td>\n Figure 4 \u2013 Loop resistance measurement <\/td>\n<\/tr>\n \n 27<\/td>\n 4.4 Direct current (d.c.) resistance unbalance <\/td>\n<\/tr>\n \n 28<\/td>\n 4.5 Insertion loss
Figure 5 \u2013 DC resistance unbalance measurement <\/td>\n<\/tr>\n\n 29<\/td>\n Figure 6 \u2013 Insertion loss test configuration <\/td>\n<\/tr>\n \n 30<\/td>\n 4.6 Propagation delay and delay skew <\/td>\n<\/tr>\n \n 32<\/td>\n 4.7 Near-end cross-talk (NEXT) and power sum NEXT
Figure 7 \u2013 NEXT test configuration <\/td>\n<\/tr>\n\n 34<\/td>\n 4.8 Attenuation to crosstalk ratio, near end (ACR-N) and power sum ACR-N <\/td>\n<\/tr>\n \n 35<\/td>\n 4.9 Far-end cross-talk (FEXT) and power sum FEXT
Figure 8 \u2013 FEXT test configuration <\/td>\n<\/tr>\n\n 36<\/td>\n 4.10 Equal level far end crosstalk (ELFEXT) and attenuation to crosstalk ratio, far end (ACR-F) <\/td>\n<\/tr>\n \n 37<\/td>\n 4.11 Return loss <\/td>\n<\/tr>\n \n 38<\/td>\n Figure 9 \u2013 Return loss test configuration <\/td>\n<\/tr>\n \n 39<\/td>\n 4.12 PS alien near end crosstalk (PS ANEXT \u2013 Exogenous crosstalk) <\/td>\n<\/tr>\n \n 40<\/td>\n Figure 10 \u2013 ANEXT measurement <\/td>\n<\/tr>\n \n 42<\/td>\n 4.13 PS attenuation to alien crosstalk ratio, far end crosstalk (PS AACR-F \u2013 Exogenous crosstalk) <\/td>\n<\/tr>\n \n 43<\/td>\n Figure 11 \u2013 Alien far end crosstalk measurement <\/td>\n<\/tr>\n \n 46<\/td>\n 4.14 Unbalance attenuation, near end <\/td>\n<\/tr>\n \n 47<\/td>\n Figure 12 \u2013 Unbalance attenuation, near end test configuration <\/td>\n<\/tr>\n \n 48<\/td>\n Figure 13 \u2013 Back-to-back balun differential mode insertion loss measurement
Figure 14 \u2013 Back-to-back balun common mode insertion loss measurement <\/td>\n<\/tr>\n\n 49<\/td>\n Figure 15 \u2013 Unbalance performance test of the measurement balun <\/td>\n<\/tr>\n \n 50<\/td>\n 4.15 Unbalance attenuation, far end
Table 2 \u2013 Estimated uncertainty of unbalance, near end measurement. <\/td>\n<\/tr>\n\n 51<\/td>\n Figure 16 \u2013 Unbalance attenuation far end test configuration <\/td>\n<\/tr>\n \n 52<\/td>\n 4.16 Coupling attenuation
5 Field test measurement requirements for electrical properties
5.1 General
Table 3 \u2013 Estimated uncertainty of unbalance, far end measurement <\/td>\n<\/tr>\n\n 53<\/td>\n 5.2 Cabling configurations tested
5.3 Field test parameters <\/td>\n<\/tr>\n\n 54<\/td>\n Figure 17 \u2013 Correct pairing <\/td>\n<\/tr>\n \n 55<\/td>\n Figure 18 \u2013 Incorrect pairing <\/td>\n<\/tr>\n \n 59<\/td>\n 5.4 Power sum alien crosstalk <\/td>\n<\/tr>\n \n 60<\/td>\n Figure 19 \u2013 Schematic diagram to measure channel ANEXT loss <\/td>\n<\/tr>\n \n 61<\/td>\n Figure 20 \u2013 AFEXT loss measurement test configuration <\/td>\n<\/tr>\n \n 65<\/td>\n Figure 21 \u2013 Flow chart of the alien crosstalk test procedure <\/td>\n<\/tr>\n \n 66<\/td>\n 5.5 Data reporting and accuracy <\/td>\n<\/tr>\n \n 67<\/td>\n Figure 22 \u2013 Example of equipment tolerance region (NEXT) <\/td>\n<\/tr>\n \n 69<\/td>\n Table 4 \u2013 Summary of reporting requirements for field test equipment <\/td>\n<\/tr>\n \n 72<\/td>\n Table 5 \u2013 Minimum reporting requirement for PS\u00a0ANEXT and PS\u00a0AACR-F <\/td>\n<\/tr>\n \n 73<\/td>\n 6 Field tester measurement accuracy requirements
6.1 General <\/td>\n<\/tr>\n\n 74<\/td>\n Table 6 \u2013 Worst case propagation delay, delay skew, d.c. resistance and length measurement accuracy for level IIE, level III and level IV test instruments <\/td>\n<\/tr>\n \n 75<\/td>\n Table 7 \u2013 Worst case insertion loss, NEXT, ACR-N, ELFEXT\/ACR-F and return loss measurement accuracy for level IIE test instruments
Table 8 \u2013 Worst case insertion loss, NEXT, ACR-N, ELFEXT\/ACR-F and return loss measurement accuracy for level\u00a0III test instruments <\/td>\n<\/tr>\n\n 76<\/td>\n Table 9 \u2013 Worst case insertion loss, NEXT, ACR-N, ELFEXT\/ACR-F and return loss measurement accuracy for level IIIE test instruments
Table 10 \u2013 Worst case insertion loss, NEXT, ACR-N, ELFEXT\/ACR-F and return loss measurement accuracy for level\u00a0IV test instruments <\/td>\n<\/tr>\n\n 77<\/td>\n 6.2 Measurement accuracy specifications common to level IIE, level III, level IIIE, and level IV field testers
6.3 Accuracy performance requirements for level IIE field testers
Table 11 \u2013 Propagation delay, delay skew, d.c. resistance and length accuracy performance specifications <\/td>\n<\/tr>\n\n 78<\/td>\n Table 12 \u2013 Level IIE field tester accuracy performance parameters per IEC guidelines <\/td>\n<\/tr>\n \n 79<\/td>\n 6.4 Accuracy performance requirements for level III field testers <\/td>\n<\/tr>\n \n 80<\/td>\n Table 13 \u2013 Level III field tester accuracy performance parameters per IEC guidelines <\/td>\n<\/tr>\n \n 81<\/td>\n 6.5 Accuracy performance requirements for level IIIE field testers <\/td>\n<\/tr>\n \n 82<\/td>\n Table 14 \u2013 Level IIIE field tester accuracy performance parameters per IEC guidelines <\/td>\n<\/tr>\n \n 83<\/td>\n 6.6 Accuracy performance requirements for level IV field testers <\/td>\n<\/tr>\n \n 84<\/td>\n Table 15 \u2013 Level IV field tester accuracy performance parameters per IEC guidelines <\/td>\n<\/tr>\n \n 85<\/td>\n 6.7 Accuracy performance requirements for level IV field testers over 600\u00a0MHz
6.8 Field tester requirements applicable to alien crosstalk measurements
6.9 Procedures for determining field tester parameters <\/td>\n<\/tr>\n\n 86<\/td>\n Figure 23 \u2013 Block diagram for measuring output signal balance <\/td>\n<\/tr>\n \n 87<\/td>\n Figure 24 \u2013 Block diagram to measure common mode rejection <\/td>\n<\/tr>\n \n 88<\/td>\n Figure 25 \u2013 Block diagram for measuring residual NEXT
Figure 26 \u2013 Block diagram for measuring dynamic accuracy <\/td>\n<\/tr>\n\n 90<\/td>\n Figure 27 \u2013 Principle of measurement of residual NEXT
Figure 28 \u2013 Principle of alternate measurement of residual FEXT <\/td>\n<\/tr>\n\n 93<\/td>\n Figure 29 \u2013 Alien crosstalk measurement floor test for the channel test configuration <\/td>\n<\/tr>\n \n 94<\/td>\n 6.10 Measurement error models
Figure 30 \u2013 Alien crosstalk measurement floor test for the link test configurations <\/td>\n<\/tr>\n\n 99<\/td>\n 6.11 Network analyzer measurement comparisons <\/td>\n<\/tr>\n \n 100<\/td>\n Figure 31 \u2013 Construction details of special patch cord adapter <\/td>\n<\/tr>\n \n 101<\/td>\n Figure 32 \u2013 Interfaces to channel by field test and laboratory equipment to compare test results <\/td>\n<\/tr>\n \n 102<\/td>\n Figure 33 \u2013 Interfaces to link test configuration by field test and laboratory equipment to compare test results <\/td>\n<\/tr>\n \n 104<\/td>\n Figure 34 \u2013 Sample scatter plot <\/td>\n<\/tr>\n \n 106<\/td>\n Annex A (informative) Uncertainty and variability of field test results <\/td>\n<\/tr>\n \n 107<\/td>\n Figure A.1 \u2013 Source of variability during link testing <\/td>\n<\/tr>\n \n 110<\/td>\n Annex B (normative) Reference laboratory test configuration for alien crosstalk testing <\/td>\n<\/tr>\n \n 113<\/td>\n Annex C (informative) General information on power sum alien crosstalk performance of installations <\/td>\n<\/tr>\n \n 114<\/td>\n Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Specification for the testing of balanced and coaxial information technology cabling – Installed balanced cabling as specified in the standards series EN 50173<\/b><\/p>\n
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\n Published By<\/td>\n Publication Date<\/td>\n Number of Pages<\/td>\n<\/tr>\n \n BSI<\/b><\/a><\/td>\n 2010<\/td>\n 116<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":233076,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[630,2641],"product_tag":[],"class_list":{"0":"post-233072","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-33-120-10","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/233072","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/233076"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=233072"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=233072"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=233072"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}