TIA-455-126:2007

$29.25

Spectral Characterization of LEDs

Published By	Publication Date	Number of Pages
TIA	2007	28

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Description

Introduction

Intent

The intent of this test procedure is to measure the central
wavelength, peak wavelength, and the spectral width (RMS and FWHM)
of a semiconductor light-emitting diode (LED) using a dispersive
spectrophotometric method (that is, using a revolving diffraction
grating) or other suitable methods.

NOTE:

RMS
is the Root Mean Square and FWHM is the Full Width Half Maximum (3
dB down).

Accuracy and precision

The uncertainty of the procedure is determined by the
uncertainty of the optical spectrum analyzer and the number of data
points selected. The precision of the method is determined by the
precision of the optical spectrum analyzer and the resolution
setting used. The precision of this procedure may be enhanced by
averaging several sweeps.

Hazards

This procedure involves measurements of energized optical
sources. Exercise care to avoid possible eye damage. Do not look
into the end of an energized fiber directly or with a magnification
device.

Applications

This procedure is applicable to all light-emitting
diodes.

Additional information