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ISO 17331:2004/Amd 1:2010

$6.50

Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy — Amendment 1

Published By Publication Date Number of Pages
ISO 2010-07 8
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Published Code

ISO

Published By

International Organization for Standardization

Publication Date

2010-07

Pages Count

8

Language

English

Edition

1

File Size

133.1 KB

ICS Codes 71.040.40 - Chemical analysis
ISO 17331:2004/Amd 1:2010
$6.50