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BSI PD IEC/TR 62660-4:2017

BSI PD IEC/TR 62660-4:2017

$167.15

Secondary lithium-ion cells for the propulsion of electric road vehicles – Candidate alternative test methods for the internal short circuit test of IEC 62660-3

Published By Publication Date Number of Pages
BSI 2017 38
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This Part of IEC 62660 provides the test data on the candidate alternative test methods for the internal short circuit test according to 6.4.4.2.2 of IEC 62660-3:2016. The internal short circuit test in this document is intended to simulate an internal short circuit of a cell caused by the contamination of conductive particle, and to verify the safety performance of the cell under such conditions.

This document is applicable to the secondary lithium-ion cells and cell blocks used for propulsion of electric vehicles (EV) including battery electric vehicles (BEV) and hybrid electric vehicles (HEV).

NOTE This document does not cover cylindrical cells.

PDF Catalog

PDF Pages PDF Title
4 CONTENTS
6 FOREWORD
8 INTRODUCTION
9 1 Scope
2 Normative references
3 Terms and definitions
4 General provisions for alternative test
10 5 Alternative test method
5.1 Alternative test method description
5.1.1 General
5.1.2 Test preparation and test set-up
Table 1 – Recommended test specifications
11 Figures
Figure 1 – Example of test setup 1
Figure 2 – Example of test setup 2
12 5.1.3 Test execution
Figure 3 – Example of ceramic nail with Ni tip
Figure 4 – Example of ceramic nail with Ni tip test
13 5.1.4 Acceptance criteria
14 Annex A (informative)Test data
A.1 General
A.2 Test data
A.2.1 Test results
15 Table A.1 – Internal short circuit test results
20 A.2.2 Data of each test
Figure A.1 – Voltage and temperature of test 1-1
Figure A.2 – Voltage and temperature of test 1-2
21 Figure A.3 – Voltage and temperature of test 1-3
Figure A.4 – Voltage and temperature of test 2-1
22 Figure A.5 – Voltage and temperature of test 2-2
Figure A.6 – Voltage and temperature of test 2-3
23 Figure A.7 – Voltage and temperature of test 3-1
Figure A.8 – Voltage and temperature of test 3-2
24 Figure A.9 – ø3 mm ceramic nail with Ni tip
Figure A.10 – Voltage and temperature of test 4
25 Figure A.11 – Voltage and temperature of test 5-1
Figure A.12 – Voltage and temperature of test 5-2
26 Figure A.13 – Voltage data of tests 6
Figure A.14 – Voltage data of tests 7
27 Figure A.15 – Voltage data of tests 8
Figure A.16 – Voltage data of tests 9
28 Figure A.17 – Voltage data of tests 10-1
Figure A.18 – Voltage data of tests 10-2
29 Figure A.19 – Voltage data of test 11-1
Figure A.20 – Voltage data of test 11-2
30 Figure A.21 – Voltage data of test 12-1
Figure A.22 – Voltage data of test 12-2
Figure A.23 – Voltage data of test 12-3
31 Figure A.24 – Voltage data of test 12-4
Figure A.25 – Voltage data of test 12-5
Figure A.26 – Voltage data of test 12-6
32 Figure A.27 – Voltage data of test 12-7
Figure A.28 – Voltage data of test 13
33 Figure A.29 – Voltage data of test 14-1
Figure A.30 – Voltage data of test 14-2
Figure A.31 – Voltage data of test 14-3
34 Figure A.32 – Voltage data of test 14-4
Figure A.33 – Voltage data of test 14-5
35 Figure A.34 – Voltage data of tests 15
36 Figure A.35 – Voltage data of tests 16

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BSI PD IEC/TR 62660-4:2017
$167.15