BSI 19/30394914 DC:2019 Edition
$13.70
BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 20 |
| Status | Definitive |
|---|---|
| Pages | 20 |
| Publication Date | 2019-12-12 |
| Standard Number | 19/30394914 DC |
| Title | BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA) |
| Identical National Standard Of | ISO/DIS 15632 |
| Descriptors | Semiconductor diodes, Detectors, Semiconductors, X-ray fluorescence spectrometry, Spectroscopy, Electron beams, Chemical analysis and testing |
| Publisher | BSI |
| Committee | CII/9 |
| ICS Codes | 71.040.99 - Other standards related to analytical chemistry |
