🔥🔥 Don’t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

🔍
BS ISO 16700:2004

BS ISO 16700:2004

$142.49

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Published By Publication Date Number of Pages
BSI 2004 26
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Category:

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Status

Withdrawn
Title

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Publisher

BSI
Committee

CII/9
Pages

26
Publication Date

2004-09-29
Withdrawn Date

2016-07-31
Replaced By

BS ISO 16700:2016
ISBN

0 580 44519 4
Standard Number

BS ISO 16700:2004
Identical National Standard Of

ISO 16700:2004
Descriptors

Electron microscopes, Microscopes, Electron optics, Magnification, Control samples, Optical instruments, Electron beams, Scanning electron microscopes, Accuracy, Optical phenomena, Calibration
ICS Codes 37.020 - Optical equipment
BS ISO 16700:2004
$142.49