BS IEC 60747-5-4:2022 – TC 2023
$217.84
Tracked Changes. Semiconductor devices – Optoelectronic devices. Semiconductor lasers
Published By | Publication Date | Number of Pages |
BSI | 2023 | 92 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | 30462431 |
51 | A-30404096 |
52 | undefined |
56 | CONTENTS |
58 | FOREWORD |
60 | INTRODUCTION |
61 | 1 Scope 2 Normative references 3 Terms and definitions |
62 | 3.1 Physical concepts |
63 | 3.2 Types of devices 3.3 General terms |
64 | 3.4 Terms related to ratings and characteristics 3.4.1 Switching times Figures Figure 1 – Example of the device with window but without lens |
66 | 3.4.2 Output and current characteristics Figure 2 – Switching times |
68 | Figure 3 – Threshold current of a laser diode |
69 | 3.5 Spatial profiles and spectral characteristics 4 Essential rating and characteristics 4.1 Type 4.2 Semiconductor 4.2.1 Material 4.2.2 Structure |
70 | 4.3 Details of outline drawing and encapsulation 4.4 Limiting values (absolute maximum ratings over the operating temperature range, unless otherwise stated) 4.5 Electrical and optical characteristics |
71 | Table 1 – Electrical and optical characteristics |
72 | 4.6 Supplementary information 5 Measurement methods 5.1 Power measurement 5.2 Output stability 5.2.1 Relative intensity noise 5.2.2 Carrier-to-noise ratio |
73 | Figure 4 – Basic circuit diagram |
74 | 5.2.3 Output power stability 5.2.4 Output energy stability 5.2.5 Temporal pulse shape 5.3 Time domain profile 5.3.1 Switching times |
75 | Figure 5 – Basic circuits diagram |
76 | 5.3.2 Small signal cut-off frequency (fc) 5.4 Lifetime Figure 6 – Typical pulse response diagram |
77 | 5.5 Optical characteristics of the laser beam 5.5.1 Polarization 5.5.2 Half-intensity angle θ1/2 and 1/e2-intensity angle θ1/e2 Figure 7 – Half-intensity angle Figure 8 – Relationship between the specified plane and the mechanical reference plane |
78 | Figure 9 – Basic measurement setup diagram |
79 | 5.5.3 Half-intensity width D1/2 and 1/e2-intensity width D1/e2 Figure 10 – Measuring arrangement for D1/2 and D1/e2 |
80 | 5.5.4 Spectral characteristics and other spatial profile |
81 | Annex A (informative)Reference list of technical terms and definitions related tospatial profile and spectral characteristics |
85 | Annex B (informative)Reference list of measurement methods related to spatial profileand spectral characteristics |
86 | Annex C (informative)Reference list of technical terms and definitions, and measurement methods, related to power measurement and lifetime |
87 | Bibliography |