BS EN ISO 21068-4:2024
$102.76
Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon – XRD methods
Published By | Publication Date | Number of Pages |
BSI | 2024 | 20 |
This document describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer. It includes details of sample preparations and general principles for qualitative and quantitative analyses of mineralogical phase composition. Quantitative determination of ?-Si3N4, ?-Si3N4, Si2ON2, AlN, and ?’- SiAlON are described. For quantitative determination of ?-Si3N4, ?-Si3N4, Si2ON2, AlN and ?’- SiAlON refinement procedures based on the total nitrogen content of the sample are described. NOTE ISO 21068-3 is used for the analysis of the total nitrogen content of the sample.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
10 | 6.1 Sample preparation 6.2 Measuring parameters |
11 | 6.3 Qualitative analysis 6.4 Quantitative analysis 6.4.1 General |
12 | 6.4.2 Calculation |
15 | 7.1 Repeatability 7.2 Reproducibility |