BS EN IEC 61967-1:2019 – TC:2020 Edition
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Tracked Changes. Integrated circuits. Measurement of electromagnetic emissions – General conditions and definitions
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 71 |
IEC 61967-1:2018 is available as /2 which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61967-1:2018 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. Test method comparison tables are include in Annex A to assist in selecting the appropriate measurement method(s). The object of this document is to describe general conditions in order to establish a uniform testing environment and to obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this document are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit. The applicable frequency range is described in each part of IEC 61967. This edition includes the following significant technical changes with respect to the previous edition: – the frequency range of 150 kHz to 1 GHz has been deleted from the title; – the frequency step above 1 GHz has been added to Table 1, Table 2 and to 5.4; – Table A.1 has been divided into two tables, and IEC 61967-8 has been added to Table A.2 of Annex A; – the general test board description has been moved to Annex D.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 41 | undefined |
| 46 | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications |
| 47 | English CONTENTS |
| 49 | FOREWORD |
| 51 | 1 Scope 2 Normative references |
| 55 | 4 Test conditions 4.1 General 4.2 Ambient conditions 4.2.1 General |
| 56 | 4.2.2 Ambient temperature 4.2.3 Ambient RF field strength 4.2.4 Other ambient conditions 4.2.5 IC stability over time 5 Test equipment 5.1 General 5.2 Shielding 5.3 RF measuring instrument 5.3.1 General 5.3.2 Measuring receiver Tables Table 1 – Measuring receiver bands and resolution bandwidth (RBW) default settings |
| 57 | 5.3.3 Spectrum analyser 5.3.4 Other RBW for narrowband emissions 5.3.5 Emission type, detector type and sweep speed 5.3.6 Video bandwidth 5.3.7 Verification of calibration for the RF measuring instrument Table 2 – Spectrum analyser bands and RBW default settings |
| 58 | 5.4 Frequency range 5.5 Preamplifier or attenuator 5.6 System gain 5.7 Other components 6 Test set-up 6.1 General 6.2 Test circuit board 6.3 IC pin loading |
| 59 | 6.4 Power supply requirements – Test board power supply 6.5 IC specific considerations 6.5.1 IC supply voltage 6.5.2 IC decoupling 6.5.3 Activity of IC 6.5.4 Guidelines regarding IC operation Table 3 – IC pin loading recommendations |
| 60 | 7 Test procedure 7.1 Ambient RF noise check 7.2 Operational check 7.3 Specific procedures 8 Test report 8.1 General 8.2 Ambient RF noise 8.3 Description of device |
| 61 | 8.4 Description of set-up 8.5 Description of software 8.6 Data presentation 8.6.1 General 8.6.2 Graphical presentation 8.6.3 Measurement data 8.6.4 Data processing 8.7 RF emission limits 8.8 Interpretation of results 8.8.1 Comparison between IC(s) using the same test method 8.8.2 Comparison between different test methods 8.8.3 Correlation to module test methods |
| 62 | Annex A (informative) Test method comparison tables Table A.1 – Conducted emission |
| 63 | Table A.2 – Radiated emission |
| 64 | Annex B (informative) Flow chart of a counter test code Figure B.1 – Test code flow chart |
| 65 | Annex C (informative) Description of worst-case application software Figures |
| 66 | Annex D (informative) General test board description D.1 General D.2 Board description – Mechanical D.3 Board description – Electrical D.4 Ground planes Table D.1 – Position of vias over the board |
| 67 | D.5 Package pins D.5.1 General D.5.2 DIL packages D.5.3 SOP, PLCC, QFP packages D.5.4 PGA packages D.5.5 BGA packages D.6 Via diameters D.7 Via distance D.8 Additional components D.9 Supply decoupling D.9.1 General |
| 68 | D.9.2 IC decoupling capacitors D.9.3 Power supply decoupling for the test board D.10 I/O load |
| 69 | Figure D.1 – Example of an emission test board |
| 70 | Bibliography |
