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ASTM-F775 1988

$40.63

F775-88 Test Method for Wafer and Slice Flatness by Interferometric (Withdrawn 1991)

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ASTM 1988
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ASTM F775-88

Withdrawn Standard: Test Method for Wafer and Slice Flatness by Interferometric (Withdrawn 1991)

ASTM F775

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ICS Code

ICS Number Code 29.045 (Semiconducting materials)

DOI:

ASTM-F775 1988
$40.63