ASTM-E1855:2004 Edition

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E1855-04e1 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

Published By	Publication Date	Number of Pages
ASTM	2004	11

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Description

ASTM E1855-04e1

Historical Standard: Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

ASTM E1855

Scope

1.1 This test method covers the use of 2N2222A silicon bipolar transistors as dosimetry sensors in the determination of neutron energy spectra, and as silicon 1-MeV equivalent displacement damage fluence monitors.

1.2 The neutron displacement damage is especially valuable as a spectrum sensor in the range 0.1 to 2.0 MeV when fission foils are not available. It has been applied in the fluence range between 2 × 10 12 n/cm² and 1 × 10¹⁴ n/cm² and should be useful up to 1015 n/cm². This test method details the steps for the acquisition and use of silicon 1-MeV equivalent fluence information (in a manner similar to the use of activation foil data) for the determination of neutron spectra.

1.3 In addition, this sensor can provide important confirmation of neutron spectra determined with other sensors, and yields a direct measurement of the silicon 1-MeV fluence by the transfer technique.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.

Keywords

displacement damage; neutron damage; radiation hardness; silicon transistors; spectrum sensors

ICS Code

ICS Number Code 31.200 (Integrated circuits. Microelectronics)

DOI: 10.1520/E1855-04E01

PDF Catalog

PDF Pages	PDF Title
1	Scope Referenced Documents Terminology
2	Summary of Test Method Significance and Use Apparatus FIG. 1
3	Description of the Test Method FIG. 2
4	Experimental Procedure
6	Use of as a Spectrum Sensor Response Precision and Bias
7	Keywords X1. ERROR AMPLIFICATION X1.1 X1.2 FIG. X1.1
8	X2. DAMAGE ANNEALING X2.1 Measured Damage after Multiple Hard Anneals without Light Anneals FIG. X2.1
9	X3. SAMPLE DATA SHEET X3.1 X3.2
10	X3.3 REFERENCES

Additional information

Standard Title	E1855-04e1 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Published Code	ASTM
Publication Date	2004
Pages Count	11