AS 2879.7:1997 (R2013)
$37.70
Alumina – Determination of trace elements – Wavelength dispersive X-ray fluorescence spectrometric method
Published By | Publication Date | Number of Pages |
AS | 1997-01-05 | 33 |
Sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorous, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel, expressed as the oxides on an as-received basis.
Scope
This Standard sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel (expressed as the oxides
Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3, K2O, CuO, Cr2O3
and NiO on an as-received basis).
The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is given in Table 1.