{"id":358990,"date":"2024-10-20T01:23:57","date_gmt":"2024-10-20T01:23:57","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pas-1392012\/"},"modified":"2024-10-26T02:02:34","modified_gmt":"2024-10-26T02:02:34","slug":"bsi-pas-1392012","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pas-1392012\/","title":{"rendered":"BSI PAS 139:2012"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
5<\/td>\n | \t\tForeword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | \t0\tIntroduction \t1\tScope <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | \t2\tTerms and definitions <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | \t3\tMeasurands \t3.1\tGeneral \t3.2\tSize and size distribution <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | \t3.3\tElemental composition and elemental and isotopic ratio \t3.4\tSurface charge <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | \t3.5\tShape \t3.6\tCrystal structure \t3.7\tSpecific surface area (SSA) <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | \t3.8\tSurface chemistry \t3.9\tAgglomeration and aggregation \t3.10\tCombination of measurands <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | \t4\tSampling, storage and transport \t4.1\tSampling <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | \t4.2\tTransport and storage <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | \t5\tSample preparation \t5.1\tGeneral \t5.2\tFiltration and ultrafiltration (UF) <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | \t5.3\tField flow fractionation (FFF) <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | \t5.4\tSample preparation for inductively coupled plasma mass spectrometry (ICP-MS) <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | \t5.5\tSample preparation for electron microscopy (EM) and atomic force microscopy (AFM) \t5.6\tSample preparation for dynamic light scattering (DLS) <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | \t5.7\tSample preparation for Brunauer-Emmett-Teller (BET) \t5.8\tSample preparation for X-ray photoelectron spectroscopy (XPS) \t6\tSeparation, measurement and analytical techniques \t6.1\tGeneral \t6.2\tInductively coupled plasma mass spectrometry (ICP-MS) <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | \t6.3\tElectron microscopy (EM) <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | \t6.4\tAtomic force microscopy (AFM) \t6.5\tDynamic light scattering (DLS) <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | \t6.6\tBrunauer-Emmett-Teller (BET) SSA \t6.7\tX-ray photoelectron spectroscopy (XPS) \t6.8\tDialysis \t6.9\tField flow fractionation (FFF) \t6.10\tUltraviolet-visible (UV-Vis) spectroscopy <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | \t6.11\tFourier transform infra-red spectroscopy (FTIR) \t6.12\tRaman spectroscopy \t6.13\tMulti-method approaches to characterization \t7\tReporting of results <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Table 1\u2003\ufffdSummary of separation and analytical techniques which can be used for the detection and\/or characterization of nano-objects in complex matrices <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | \t\tBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Detection and characterization of manufactured nano-objects in complex matrices. Guide<\/b><\/p>\n |